A review of the most recent progresses of state-of-art gallium oxide power devices

H Zhou, J Zhang, C Zhang, Q Feng… - Journal of …, 2019 - iopscience.iop.org
Until very recently, gallium oxide (Ga 2 O 3) has aroused more and more interests in the
area of power electronics due to its ultra-wide bandgap of 4.5–4.8 eV, estimated critical field …

Steep-slope hysteresis-free negative capacitance MoS2 transistors

M Si, CJ Su, C Jiang, NJ Conrad, H Zhou… - Nature …, 2018 - nature.com
The so-called Boltzmann tyranny defines the fundamental thermionic limit of the
subthreshold slope of a metal–oxide–semiconductor field-effect transistor (MOSFET) at 60 …

A review on efficient self-heating in nanowire sensors: Prospects for very-low power devices

C Fàbrega, O Casals, F Hernández-Ramírez… - Sensors and Actuators B …, 2018 - Elsevier
Self-heating operation, or the use of the resistance-probing signal to warm up and control
the temperature of nanowire devices, has been the subject of research for more than a …

β-Ga2O3 on insulator field-effect transistors with drain currents exceeding 1.5 A/mm and their self-heating effect

H Zhou, K Maize, G Qiu, A Shakouri, PD Ye - Applied Physics Letters, 2017 - pubs.aip.org
We have demonstrated that depletion/enhancement-mode β-Ga 2 O 3 on insulator field-
effect transistors can achieve a record high drain current density of 1.5/1.0 A/mm by utilizing …

Thickness-dependent thermal conductivity of mechanically exfoliated β-Ga2O3 thin films

Y Zhang, Q Su, J Zhu, S Koirala, SJ Koester… - Applied Physics …, 2020 - pubs.aip.org
Beta-phase gallium oxide (β-Ga 2 O 3), the most thermally stable phase of Ga 2 O 3, has
stimulated great interest in power electronics due to its ultra-wide bandgap (∼ 4.9 eV) and …

Thermodynamic Studies of β-Ga2O3 Nanomembrane Field-Effect Transistors on a Sapphire Substrate

H Zhou, K Maize, J Noh, A Shakouri, PD Ye - ACS omega, 2017 - ACS Publications
The self-heating effect is a severe issue for high-power semiconductor devices, which
degrades the electron mobility and saturation velocity, and also affects the device reliability …

Layout design correlated with self-heating effect in stacked nanosheet transistors

L Cai, W Chen, G Du, X Zhang… - IEEE Transactions on …, 2018 - ieeexplore.ieee.org
With technology node scaling down to 5 nm, the narrow device geometry confines the
material thermal conductivity and further aggravates the self-heating effect in gate-all-around …

Improvement in self-heating characteristic by incorporating hetero-gate-dielectric in gate-all-around MOSFETs

YS Song, JH Kim, G Kim, HM Kim… - IEEE Journal of the …, 2020 - ieeexplore.ieee.org
For improving self-heating effects (SHEs) in gate-all-around metal-oxide-semiconductor field-
effect transistors (GAA MOSFETs), hetero-gate-dielectric (HGD) is utilized. The HGD consists …

A device-to-system perspective regarding self-heating enhanced hot carrier degradation in modern field-effect transistors: A topical review

MA Alam, BK Mahajan, YP Chen, W Ahn… - … on Electron Devices, 2019 - ieeexplore.ieee.org
As foreseen by Keyes in the late 1960s, the self-heating effect has emerged as an important
concern for device performance, output power density, run-time variability, and reliability of …

Impact of self-heating effect on transistor characterization and reliability issues in sub-10 nm technology nodes

Y Zhao, Y Qu - IEEE Journal of the Electron Devices Society, 2019 - ieeexplore.ieee.org
FinFET and fully depleted silicon-on-insulator (FDSOI) structures could further improve
transistor's performance and, however, also introduce some new problems, especially the …