[图书][B] Hierarchical device simulation: the Monte-Carlo perspective

C Jungemann, B Meinerzhagen - 2012 - books.google.com
This book summarizes the research of more than a decade. Its early motivation dates back to
the eighties and to the memorable talks Dr. C. Moglestue (FHG Freiburg) gave on his Monte …

Monte Carlo analysis of dynamic and noise performance of submicron MOSFETs at RF and microwave frequencies

R Rengel, J Mateos, D Pardo… - Semiconductor …, 2001 - iopscience.iop.org
In this paper, an ensemble 2D bipolar Monte Carlo simulator is employed for the study of
static characteristics, high-frequency response and noise behaviour in a 0.3 µm gate-length …

Hierarchical 2-D DD and HD noise simulations of Si and SiGe devices II. Results

C Jungemann, B Neinhus, S Decker… - … on Electron Devices, 2002 - ieeexplore.ieee.org
For pt. I see ibid., vol. 49, pp. 1250-1257 (2002). Terminal current noise is investigated with
Langevin-type drift-diffusion (DD) and hydrodynamic (HD) noise models for one …

A microscopic interpretation of the RF noise performance of fabricated FDSOI MOSFETs

R Rengel, MJ Martín, T González… - IEEE transactions on …, 2006 - ieeexplore.ieee.org
In this paper, a detailed research of the high-frequency noise sources and figures of merit
(FOMs) of fabricated deep-submicrometer n-channel fully depleted silicon-on-insulator …

Quasiballistic transport in nanometer Si metal-oxide-semiconductor field-effect transistors: Experimental and Monte Carlo analysis

J Łusakowski, MJ Martinez, R Rengel… - Journal of applied …, 2007 - pubs.aip.org
Room temperature electron mobility (μ) in nanometer Si metal-oxide-semiconductor field-
effect transistors (MOSFETs) with gate length (LG) down to 30 nm was determined by the …

Monte Carlo simulation of noise in electronic devices: limitations and perspectives

T Gonzalez, J Mateos… - … Problems of Noise …, 2003 - ui.adsabs.harvard.edu
We review the main problems met by the Monte Carlo technique when dealing with the
study of noise in electronic devices. We also summarize the major challenges in the noise …

Microscopic modelling of reverse biased Schottky diodes: influence of non-equilibrium transport phenomena

E Pascual, R Rengel, MJ Martín - Semiconductor science and …, 2007 - iopscience.iop.org
A Monte Carlo investigation of charge transport—including quantum tunnelling effects—
across Schottky barriers (both n-type and p-type) in the reverse bias regime is presented …

Numerical and experimental study of a 0.25 µm fully-depleted silicon-on-insulator MOSFET: static and dynamic radio-frequency behaviour

R Rengel, J Mateos, D Pardo, T Gonzalez… - Semiconductor …, 2002 - iopscience.iop.org
We investigate the static and dynamic characteristics of a 0.25 µm gate-length fully-depleted
silicon-on-insulator metal–oxide–semiconductor field effect transistor. Considering properly …

High-frequency noise in FDSOI MOSFETs: a Monte Carlo investigation

R Rengel, J Mateos, D Pardo… - Noise in Devices …, 2003 - spiedigitallibrary.org
Due to the enormous industrial interest of the SOI MOSFET technology, a proper
understanding of the physics underlying the behavior of these devices is necessary in order …

Current drive in n-type Schottky Barrier MOSFETs: a Monte Carlo study

E Pascual, R Rengel, MJ Martin - 2009 Spanish Conference on …, 2009 - ieeexplore.ieee.org
In this paper we present a Monte Carlo study of the static performance of Schottky barrier
(SB) SOI MOSFETs. A 2D Ensemble Monte Carlo (EMC) simulator including tunnelling …