Nanocrystalline silicon thin films from SiH4 plasma diluted by H2 and He in RF-PECVD

S Samanta, D Das - Journal of Physics and Chemistry of Solids, 2017 - Elsevier
Systematic changes in structural, optical and electrical properties of nanocrystalline silicon
(nc-Si: H) films prepared at 250° C in capacitively-coupled RF-PECVD operated at 200 W of …

Study of Plasma Properties for the Low‐Temperature Deposition of Highly Conductive Aluminum Doped ZnO Film Using ICP Assisted DC Magnetron Sputtering

BB Sahu, JG Han, JB Kim, M Kumar… - Plasma Processes …, 2016 - Wiley Online Library
This work reports an investigation of the Al‐doped ZnO (AZO) film deposition process using
ICP assisted DC magnetron plasmas, at different working pressures. The mechanism of …

Analysis of intermediate pressure SiH4/He capacitively coupled plasma for deposition of an amorphous hydrogenated silicon film in consideration of thermal diffusion …

HJ Kim, HJ Lee - Plasma Sources Science and Technology, 2017 - iopscience.iop.org
To achieve rapid, uniform deposition of an amorphous hydrogenated silicon (a-Si: H) film, a
capacitively coupled plasma (CCP) is often used at an intermediate pressure (> 100 Pa) …

On the plasma chemistry during plasma enhanced chemical vapor deposition of microcrystalline silicon oxides

O Gabriel, S Kirner, M Klingsporn… - Plasma Processes …, 2015 - Wiley Online Library
The advanced opto‐electronic properties of microcrystalline silicon oxide (µc‐SiOx: H) thin
film layers deposited by means of plasma enhanced chemical vapor deposition (PECVD) …

Plasma diagnostic approach for high rate nanocrystalline Si synthesis in RF/UHF hybrid plasmas using a PECVD process

BB Sahu, JG Han, KS Shin, K Ishikawa… - Plasma Sources …, 2015 - iopscience.iop.org
Hydrogenated nanocrystalline silicon (nc-Si: H) films intended for efficient nc-Si: H solar
cells are usually made at the transition to the nanocrystalline regime using the plasma …

Uniformity control of the deposition rate profile of a-Si: H film by gas velocity and temperature distributions in a capacitively coupled plasma reactor

HJ Kim, HJ Lee - Journal of Applied Physics, 2018 - pubs.aip.org
The effect of neutral transport on the deposition rate profiles of thin films formed by plasma-
enhanced chemical vapor deposition (PECVD) is investigated to improve the uniformity of …

Effect of inductively coupled plasma and plasma parameters on magnetron sputtered Al-Doped ZnO highly conductive thin films at low-temperature

BB Sahu, SB Jin, PJ Xiang, JB Kim… - Journal of Applied Physics, 2018 - pubs.aip.org
This work reports a detailed study on the low-temperature synthesis of highly conductive
transparent Al-doped ZnO films using magnetron sputtering with the support of an …

Optimization of Silicon Heterojunction Interface Passivation on p‐and n‐Type Wafers Using Optical Emission Spectroscopy

E Özkol, P Wagner, F Ruske… - … status solidi (a), 2022 - Wiley Online Library
To increase the efficiency in p‐type wafer‐based silicon heterojunction (SHJ) technology,
one of the most crucial challenges is the achievement of excellent surface passivation …

Effects of the wall boundary conditions of a showerhead plasma reactor on the uniformity control of RF plasma deposition

HJ Kim, HJ Lee - Journal of Applied Physics, 2017 - pubs.aip.org
Technical difficulties hinder the formation of uniform deposition profiles near the electrode
edge during a deposition in a showerhead capacitively coupled plasma (CCP) reactor. The …

Wide‐bandgap p‐type microcrystalline silicon oxycarbide using additional trimethylboron for silicon heterojunction solar cells

DW Kang, P Sichanugrist, H Zhang… - Progress in …, 2017 - Wiley Online Library
We report a new wide‐bandgap p‐type microcrystalline silicon oxycarbide (p‐μc‐SiOxCy: H)
film prepared by plasma‐enhanced chemical vapor deposition. As an additional doping gas …