JR Wu, TA Lin, YR Wu, PH Chen, TS Gau, BJ Lin… - Nanoscale …, 2023 - pubs.rsc.org
Synthesis of two novel tin carboxylate clusters (RSn) 6 (R′ CO2) 8O4Cl2 is described, and their structures have been characterized by X-ray diffraction. These clusters have irregular …
MW Hasan, L Deeb, S Kumaniaev, C Wei… - …, 2024 - pmc.ncbi.nlm.nih.gov
Extreme ultraviolet lithography (EUVL) is a leading technology in semiconductor manufacturing, enabling the creation of high-resolution patterns essential for advanced …
S Nandi, L Khillare, MG Moinuddin… - ACS Applied Nano …, 2022 - ACS Publications
Inorganic resists have emerged as promising candidates in semiconductor industries to realize sub-10 nm node technology. However, controlling vertical shrinkage of resist films …
FL Yang, ZB Ye, YQ Chen, MH Wang… - New Journal of …, 2023 - pubs.rsc.org
The tin-oxo cage ([R12Sn12O14 (OH) 6] 2+) is an excellent photoresist candidate in extreme ultraviolet lithography (EUVL). Photoionization that leads to plenty of photoelectrons and …
Q Evrard, N Sadegh, S Mathew… - … Applied Materials & …, 2024 - ACS Publications
Organometallic tin-oxo-hydroxo cage compounds offer a promising photoresist platform for extreme ultraviolet photolithography (EUVL). Their reactivity is dominated by the facile …
AM Brouwer - Journal of Photopolymer Science and Technology, 2022 - jstage.jst.go.jp
抄録 Hybrid organic/inorganic materials are considered as the Extreme Ultraviolet photoresists of the future. Compared to chemically amplified polymer-based photoresists …
YK Kang, H Kim, SJ Lee, DS Oh, YH Yoon, CJ Kim… - Applied Surface …, 2024 - Elsevier
The semiconductor industry is currently transitioning to advanced extreme-ultraviolet lithography (EUVL) to address the challenges facing the use of photolithography in …
T Kozawa - Japanese Journal of Applied Physics, 2024 - iopscience.iop.org
The high-volume production of semiconductor devices with EUV lithography started in 2019. During the development of EUV lithography, the resist materials had always been ranked …
N Sadegh, Q Evrard, N Mahne, A Giglia… - Journal of …, 2023 - jstage.jst.go.jp
Extreme Ultraviolet Lithography photoresists undergo chemical reactions initiated by ionizing radiation. Understanding the decay pathways in the photoresist following …