Unwanted motion of the probe with respect to the sample is a ubiquitous problem in
scanning probe and scanning transmission electron microscopies, causing both linear and …

We report the development of revolving scanning transmission electron microscopy–
RevSTEM–a technique that enables characterization and removal of sample drift distortion …

This article provides a review of quantitative annular dark-field imaging in the scanning
transmission electron microscope, paying particular attention to the methods of image …

Aberration corrected scanning transmission electron microscopes (STEM) enable to
determine local strain fields, composition and bonding states at atomic resolution. The …

Correcting scan-positional errors is critical in achieving electron ptychography with both high
resolution and high precision. This is a demanding and challenging task due to the sheer …

High-quality image reconstruction techniques allow the generation of high pixel density
images from a set of low-resolution micrographs. In general, these techniques consist of two …

The structure of an incommensurate 90°〈 110〉 tilt grain boundary in gold was
characterized by atomic resolution aberration-corrected electron microscopy and compared …

A method for the reciprocal space treatment of high-resolution transmission electron
microscopy (HR-TEM) and high-resolution scanning transmission electron microscopy (HR …

In this work, a new method to determine and correct the linear drift for any crystalline
orientation in a single-column-resolved high-resolution scanning transmission electron …

From simple averaging to more sophisticated registration and restoration strategies, such as
super-resolution (SR), there exist different computational techniques that use a series of …