A Jafari, M Raji, B Ghavami - IEEE Transactions on Circuits and …, 2020 - ieeexplore.ieee.org
Manufacturing process variations and transistor's aging effects are two major concerns for reliable design of nano-scale digital circuits. Correct functionality of flip-flops (FFs), as one of …
J Maier, A Steininger, R Najvirt - IEEE Transactions on Circuits …, 2023 - ieeexplore.ieee.org
For clock and data transitions in close temporal proximity, synchronous memory elements potentially enter metastability, which leads to unintended output behavior. Although …
This paper describes the process variation tolerant design of DFFs for low voltage operation. Within-die random variation have a strong impact on the delay performance of DFF …