CMOS manufacturing environments are surrounded with symptoms that can indicate serious
test, design, or reliability problems, which, in turn, can affect the financial as well as the …

It is little more than 15-years since the idea of Iddq testing was first proposed. Many
semiconductor companies now consider Iddq testing as an integral part of the overall testing …

Understanding the effectiveness of their production tests is a critical task for IC suppliers.
Numerous trends suggesting that conventionally applied test methods must change to meet …

In this paper we demonstrate that performing I/sub DDQ/testing against a single threshold
current value does not make sense. In place of the single current threshold we propose the" …

Analysis of IC technology trends indicates that Iddq testing may be approaching its limits of
applicability. The new concept of the current signature may expand this limit under the …

The electrical and test properties of several logic gate open circuit defect structures were
measured. Results indicate that tunneling current across fine geometry discontinuities …

The advent of MEMS (microelectromechanical systems) will enable dramatic changes in
semiconductor processing. MEMS-based devices offer opportunities to achieve higher …

The behavior of an MOS transistor with an open in the polygate path (floating transistor gate
defect) is investigated and its effect on the quiescent power supply current I/sub DDQ/is …

Testing techniques for VLSI circuits are undergoing many exciting changes. The
predominant method for testing digital circuits consists of applying a set of input stimuli to the …

We present a new method for testing digital CMOS integrated circuits. The new method is
based on the following premise: monitor the switching behavior of a circuit as opposed to the …