With the development of microwave chips toward high integration, new challenges have
been posed to high-precision microwave field test techniques. In this article, we propose a …

Scanning microwave microscopy (SMM) is a novel metrological tool that advances the
quantitative, nanometric, high-frequency, electrical characterization of a broad range of …

Exploring nanoscale material properties through light-matter interactions is essential to
unveil new phenomena and manipulate materials at the atomic level, paving the way for …

A novel approach for flow velocity measurements on a microfluidic chip using near-field
scanning microwave microscopy (NSMM) is proposed. It does not require the tested sample …

Micro-nano-electromechanical resonators play a more and more important role in various
domains, such as sensing, high frequency communications, and even in fundamental …

Морфологические исследования таких объектов как митохондрии чаще всего имеют
малую точность, а также большую погрешность измерения. Данная проблема является …