Spectroscopic ellipsometry and FTIR characterization of annealed SiOxNy: H films prepared by PECVD

M Boulesbaa - Optical Materials, 2021 - Elsevier
We investigated the optical and the vibrational properties of amorphous SiO x N y: H thin
films deposited on silicon substrate using the plasma enhanced chemical vapor deposition …

Ellipsometric studies of nickel oxide thin films synthesized via spray pyrolysis at varied substrate temperatures for optoelectronic applications

A Bounegab, M Boulesbaa - Spectroscopy Letters, 2023 - Taylor & Francis
The impacts of the substrate temperature on diverse microstructural, morphological, and
optical features of the nickel oxide films deposited via spray pyrolysis were examined. The X …

Optical and physicochemical properties of hydrogenated silicon nitride thin films: Effect of the thermal annealing

M Boulesbaa - Spectroscopy Letters, 2017 - Taylor & Francis
The effect of thermal annealing on the optical and physicochemical properties of
hydrogenated silicon nitride films was studied. These films were deposited by plasma …

Modeling of birefringence properties in SiOxNy film rib optical waveguides

M Boulesbaa, A Bouchekhlal… - 2018 International …, 2018 - ieeexplore.ieee.org
In this paper, a contribution to the study and dimensioning of a ridge waveguide based on
SiOxNy material was carried out. The SiO x N y guide can be prepared by the PECVD …

Study, realization and characterization of thin films based on TCO for micro-technology applications.

A BOUNEGAB - 2024 - dspace.univ-ouargla.dz
Transparent conducting oxides (TCOs) are materials with dual property of elec-trical
conductivity and transparency in the visible, making them ideal candidates for applications …

Classification of the Categories of Amorphous Hydrogenated Silicon Oxynitride Films Using Infrared Spectroscopy

M Boulesbaa, A Bouchekhlal - ICREEC 2019: Proceedings of the 1st …, 2020 - Springer
In this paper, a contribution to the classification of the various categories of amorphous
hydrogenated silicon oxynitride films using infrared spectroscopy has been carried out. A …

Design and simulation of SiOxNy thin films based planar optical waveguide for integrated optics

M Boulesbaa, R Mahamdi, L Saci - 2013 8th International …, 2013 - ieeexplore.ieee.org
From the previous work on the investigation “Ellipsometric and Rutherford back scattering
spectroscopy studies of SiO x N y Films Elaborated by plasma-enhanced chemical vapor …