Growth and applications of GeSn-related group-IV semiconductor materials

S Zaima, O Nakatsuka, N Taoka… - … and technology of …, 2015 - iopscience.iop.org
We review the technology of Ge 1− x Sn x-related group-IV semiconductor materials for
developing Si-based nanoelectronics. Ge 1− x Sn x-related materials provide novel …

A review of graphene synthesis by indirect and direct deposition methods

Y Wu, S Wang, K Komvopoulos - Journal of Materials Research, 2020 - cambridge.org
The unique properties of graphene have led to the use of this allotrope of carbon in a wide
range of applications, including semiconductors, energy devices, diffusion barriers, heat …

Metal-induced layer exchange of group IV materials

K Toko, T Suemasu - Journal of Physics D: Applied Physics, 2020 - iopscience.iop.org
Layer exchange (LE) is an interesting phenomenon in which metal and semiconductor
layers exchange during heat treatment. A great deal of effort has been put into research on …

Au quantum dots engineered room temperature crystallization and magnetic anisotropy in CoFe 2 O 4 thin films

SE Shirsath, X Liu, MHN Assadi, A Younis… - Nanoscale …, 2019 - pubs.rsc.org
For the first time, this work presents a novel room temperature time-effective concept to
manipulate the crystallization kinetics and magnetic responses of thin films grown on …

Plasma enhanced atomic layer deposition of Ga 2 O 3 thin films

RK Ramachandran, J Dendooven… - Journal of Materials …, 2014 - pubs.rsc.org
Amorphous Ga2O3 thin films have been grown on SiO2/Si substrates by atomic layer
deposition (ALD) using tris (2, 2, 6, 6-tetramethyl-3, 5-heptanedionato) gallium (III)[Ga …

Low-temperature atomic layer deposition of platinum using (methylcyclopentadienyl) trimethylplatinum and ozone

J Dendooven, RK Ramachandran… - The Journal of …, 2013 - ACS Publications
Thermal atomic layer deposition (ALD) of platinum is usually achieved using molecular
oxygen as the reactant gas and deposition temperatures in the 250–300° C range. In this …

[HTML][HTML] Metal-induced lateral crystallization of germanium thin films

T Ishiyama, K Igura, T Suemasu, K Toko - Materials & Design, 2023 - Elsevier
Recent advances in polycrystalline Ge layers formed through solid-phase crystallization
have demonstrated carrier mobilities superior to those of single-crystal Si. In this study, we …

In situ X-ray diffraction study of the controlled oxidation and reduction in the V–O system for the synthesis of VO 2 and V 2 O 3 thin films

G Rampelberg, B De Schutter, W Devulder… - Journal of Materials …, 2015 - pubs.rsc.org
VO2 and V2O3 thin films have been prepared by controlled oxidation and reduction
reactions in the vanadium–oxygen system. During these reactions, crystalline phase …

In situ x-ray diffraction study of graphitic carbon formed during heating and cooling of amorphous-C/Ni bilayers

KL Saenger, JC Tsang, AA Bol, JO Chu, A Grill… - Applied Physics …, 2010 - pubs.aip.org
We examine graphitization of amorphous carbon (aC) in aC/Ni bilayer samples having the
structure Si/SiO 2/aC (3–30 nm)/Ni (100 nm). In situ x-ray diffraction (XRD) measurements …

High carrier mobility in orientation-controlled large-grain (≥ 50 μm) Ge directly formed on flexible plastic by nucleation-controlled gold-induced-crystallization

JH Park, K Kasahara, K Hamaya, M Miyao… - Applied Physics …, 2014 - pubs.aip.org
High-carrier-mobility semiconductors on flexible-plastic are essential to realize flexible
electronics. For this purpose, electrical properties of orientation-controlled large-grain Ge …