Double-gate junctionless 1T DRAM with physical barriers for retention improvement

MHR Ansari, N Navlakha, JY Lee… - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
In this article, a double-gate (DG) junction-less (JL) transistor with physical barriers is
proposed for one-transistor dynamic random-access memory (1T DRAM) application. In this …

1T-DRAM with shell-doped architecture

MHR Ansari, N Navlakha, JT Lin… - IEEE Transactions on …, 2018 - ieeexplore.ieee.org
This paper reports on the usefulness of shell-doped (SD) junctionless (JL) transistor
architecture for operation as capacitorless dynamic random-access memory (1T-DRAM). SD …

Capacitorless 2T-DRAM for higher retention time and sense margin

MHR Ansari, J Singh - IEEE Transactions on Electron Devices, 2020 - ieeexplore.ieee.org
This article showcases a junctionless (JL)/accumulation mode (AM) transistor connected
with an access JL transistor-based capacitorless dynamic random access memory (2T …

Revisiting Lateral-BTBT Gate-Induced Drain Leakage in Nanowire FETs for 1T-DRAM

MDY Bashir, AK Jaiswal, SD Patel… - IEEE Transactions on …, 2024 - ieeexplore.ieee.org
In this work, we revisit the lateral band-to-band tunneling (L-BTBT) gate-induced drain
leakage (GIDL) in gate-all-around (GAA) nanowire field-effect transistors (NWFETs) which is …

Raised body doping-less 1T-DRAM with source/drain Schottky contact

JT Lin, WT Sun, HH Lin, YJ Chen… - IEEE Journal of the …, 2019 - ieeexplore.ieee.org
In this paper, we propose a novel structure of doping-less 1T-DRAM with raised body and
Schottky contact to source/drain regions which uses thermionic emission to generate …

Enhancing multi-functionality of reconfigurable transistors by implementing high retention capacitorless dynamic memory

YV Bhuvaneshwari, A Kranti - Semiconductor Science and …, 2021 - iopscience.iop.org
A key indicator of multi-functional attributes of a transistor is technological competiveness vis-
à-vis existing architectures. Apart from the well-known logic circuit implementation through …

Reliability improvement of 1T DRAM based on feedback transistor by using local partial insulators

D Jang, MHR Ansari, G Kim, S Cho… - Japanese Journal of …, 2021 - iopscience.iop.org
This paper proposes a one-transistor dynamic random-access memory (1 T DRAM) with
local partial insulator (LPI) to increase data retention time. Proposed 1 T DRAM cell has …

Investigation of modified 1T DRAM with twin gate tunneling field effect transistor for improved retention characteristics

DC Han, DJ Jang, JY Lee, S Cho, IH Cho - Journal of Semiconductor …, 2020 - dbpia.co.kr
This paper proposes a one transistor dynamic random access memory (1T DRAM) with
localized partial insulator (LPI) to increase data retention time. Proposed 1T DRAM cell is …

Bi-directional junctionless transistor for logic and memory applications

M Gupta, A Kranti - IEEE Transactions on Electron Devices, 2019 - ieeexplore.ieee.org
This article reports on logic and memory functionality of vertically stacked bidirectional
junctionless (BiJL) transistor, which can be operated as nMOS or pMOS depending on the …

Improving charge retention in capacitorless DRAM through material and device innovation

MHR Ansari, N Navlakha, JT Lin… - Japanese Journal of …, 2019 - iopscience.iop.org
In this work, we report on the opportunities to enhance the retention time (RT) of an
accumulation mode capacitorless DRAM (1T-DRAM) through appropriate material …