Built-in self-test (BIST) methods for MEMS: A review

G Hantos, D Flynn, MPY Desmulliez - Micromachines, 2020 - mdpi.com
A novel taxonomy of built-in self-test (BIST) methods is presented for the testing of micro-
electro-mechanical systems (MEMS). With MEMS testing representing 50% of the total costs …

Nanomaterials Based Micro/Nanoelectromechanical System (MEMS and NEMS) Devices

Z Torkashvand, F Shayeganfar, A Ramazani - Micromachines, 2024 - mdpi.com
The micro-and nanoelectromechanical system (MEMS and NEMS) devices based on two-
dimensional (2D) materials reveal novel functionalities and higher sensitivity compared to …

What MEMS research and development can learn from a production environment

MF Niekiel, JM Meyer, H Lewitz, A Kittmann, MA Nowak… - Sensors, 2023 - mdpi.com
The intricate interdependency of device design and fabrication process complicates the
development of microelectromechanical systems (MEMS). Commercial pressure has …

A general closed-form solution for the static pull-in voltages of electrostatically actuated MEMS/NEMS

EM Miandoab, HN Pishkenari, A Meghdari… - Physica E: Low …, 2017 - Elsevier
In this article, an analytical method for calculating pull-in voltage is proposed. This method
can accurately predict pull-in voltage of clamped-free, clamped-clamped and curved micro …

New Sacrificial Layer-Based Screen-Printing Process for Free-Standing Thick-Films Applied to MEMS

C Lucat, P Ginet, F Ménil - Journal of microelectronics and …, 2007 - meridian.allenpress.com
Thick-film sacrificial layers based on inorganic materials have been used for the fabrication
of free-standing screen-printed films. A specific polymer ink based on a mixture of epoxy and …

Multiphysics modeling approach for micro electro–thermo–mechanical actuator: Failure mechanisms coupled analysis

J Wang, S Zeng, VV Silberschmidt, J Guo - Microelectronics Reliability, 2015 - Elsevier
The lifetime of micro electro–thermo–mechanical actuators with complex electro–thermo–
mechanical coupling mechanisms can be decreased significantly due to unexpected failure …

[图书][B] Components of an improved design process for micro-electro-mechanical systems

KL Lamers - 2009 - search.proquest.com
During their first fifty years, MEMS have been marked by long development cycles and
tremendous potential mixed with sporadic market success. Development times have been …

Interferometric study of reliability of microcantilevers driven by AlN sandwiched between two metal layers

K Krupa, C Gorecki, R Jóźwicki, M Józwik… - Sensors and Actuators A …, 2011 - Elsevier
Micro-electro-mechanical systems are exposed to a variety of environmental stimuli, making
a prediction of operational reliability difficult. Here, we investigate environmental effects on …

A design methodology for the yield enhancement of MEMS designs with respect to process induced variations

SP Vudathu, R Laur - 2007 Proceedings 57th Electronic …, 2007 - ieeexplore.ieee.org
The intricacy in the manufacturing of MEMS devices has resulted in decreasing parametric
yields. The problem of reduced parametric yield is increasing with the waning feature sizes …

A Critical Enhancement in the Yield Analysis of Microsystems

SP Vudathu, D Boning, R Laur - 2007 IEEE International …, 2007 - ieeexplore.ieee.org
Yield analysis of microsystems is increasingly becoming important due to their decreasing
feature sizes. Despite many ways and methods for statistical yield analysis, the contribution …