In this report we review the fundamentals, applications and future tendencies of dynamic
atomic force microscopy (AFM) methods. Our focus is on understanding why the changes …

Significant progress has been made both in experimentation and in theoretical modeling of
scanning probe microscopy. The theoretical models used to analyze and interpret …

Written by three leading experts in the field, this book describes and explains all essential
aspects of scanning probe microscopy. Emphasis is placed on the experimental design and …

During the past 20 years, the manipulation of atoms and molecules at surfaces has allowed
the construction and characterization of model systems that could, potentially, act as building …

Since it was invented by Binnig et al in 1986, atomic force microscopy (AFM) has played a
crucial role in nano-scale science and technology. AFM is a microscopic technique imaging …

The current status and future prospects of non‐contact atomic force microscopy (nc‐AFM)
and Kelvin probe force microscopy (KPFM) for studying insulating surfaces and thin …

Ambient operation poses a challenge to atomic force microscopy because in contrast to
operation in vacuum or liquid environments, the cantilever dynamics change dramatically …

This review article describes progress made in scanning force microscopy of polymers
during the last 5 years including fundamental principles of SFM and recent developments in …

We analyze the mechanisms of contrast formation in noncontact SFM imaging of ionic
surfaces and calculate constant frequency shift scanlines of the perfect surfaces of NaCl …

Atomic resolution images of Cu (111) and Cu (100) surfaces obtained in ultrahigh vacuum
with a combined scanning tunneling (STM)/atomic force microscope (AFM) are presented …