Cluster secondary ion mass spectrometry (cluster SIMS) has played a critical role in the
characterization of polymeric materials over the last decade, allowing for the ability to obtain …

We demonstrate depth profiling of polymer materials by using large argon (Ar) cluster ion
beams. In general, depth profiling with secondary ion mass spectrometry (SIMS) presents …

The heart of this review is to give a compact overview of the literature on mass spectrometry
(MS) of polymers published in the time period from 2008 to 2009. Identical to the review from …

Abstract An Ar Gas Cluster Ion Beam (GCIB) has been shown to remove previous Ar+ ion
beam‐induced surface damage to a bulk polyimide (PI) film. After removal of the damaged …

This article reviews the results of molecular dynamics simulations of cluster sputtering of
hydrocarbon polymers obtained in the last few years and expand them with unpublished …

Chemical images of the surfaces and the interiors of coatings of rapamycin in poly (lactic-co-
glycolic acid)(PLGA) obtained by mass spectrometry and light scattering methods reveal a …

Alternating layers of two different organic materials, Irganox1010 and Irganox3114, have
been created using vapor deposition. The layers of Irganox3114 were very thin (∼ 2.5 nm) …

In this study, we present molecular depth profiling of multilayer structures composed of
organic semiconductor materials such as tris (8‐hydroxyquinoline) aluminum (Alq3) and 4 …

A protocol for three-dimensional molecular thin-film analysis is described that utilizes
imaging time-of-flight secondary ion mass spectrometry and large-area atomic force …

Time-of-flight secondary-ion mass spectrometry (ToF-SIMS) has been used for gaining
insights into perovskite solar cells (PSCs). However, the importance of selecting ion beam …