The emergence of multifrequency force microscopy

R Garcia, ET Herruzo - Nature nanotechnology, 2012 - nature.com
In atomic force microscopy a cantilever with a sharp tip attached to it is scanned over the
surface of a sample, and information about the surface is extracted by measuring how the …

Friction experiments on the nanometre scale

E Gnecco, R Bennewitz, T Gyalog… - Journal of Physics …, 2001 - iopscience.iop.org
In this review, we present various results obtained by friction force microscopy in the last
decade. Starting with material-specific contrast, commonly observed in friction force maps …

[图书][B] Scanning probe microscopy: the lab on a tip

E Meyer, HJ Hug, R Bennewitz - 2004 - Springer
Written by three leading experts in the field, this book describes and explains all essential
aspects of scanning probe microscopy. Emphasis is placed on the experimental design and …

Nonlinear dynamics of atomic–force–microscope probes driven in Lennard–Jones potentials

S Rützel, SI Lee, A Raman - Proceedings of the Royal …, 2003 - royalsocietypublishing.org
The near-resonant, nonlinear dynamic response of microcantilevers in atomic force
microscopy is investigated through numerical continuation techniques and simulations of …

Theory of thermoelastic damping in micromechanical resonators with two-dimensional heat conduction

S Prabhakar, S Vengallatore - Journal of …, 2008 - ieeexplore.ieee.org
Analysis of thermoelastic damping (TED) is an important component of the design of low-
loss vacuum-operated micro-and nanomechanical resonators used in microelectro …

Fluctuations and jump dynamics in atomic friction experiments

S Maier, Y Sang, T Filleter, M Grant, R Bennewitz… - Physical Review B …, 2005 - APS
Atomic stick-slip processes have been studied in detail by means of friction force microscopy
with high spatial and temporal resolution. The influence of the tip-sample contact on the …

Photoinduced force microscopy: A technique for hyperspectral nanochemical mapping

RA Murdick, W Morrison, D Nowak… - Japanese Journal of …, 2017 - iopscience.iop.org
Advances in nanotechnology have intensified the need for tools that can characterize newly
synthesized nanomaterials. A variety of techniques has recently been shown which …

Lateral-force measurements in dynamic force microscopy

O Pfeiffer, R Bennewitz, A Baratoff, E Meyer, P Grütter - Physical review B, 2002 - APS
Lateral forces between the tip of a force microscope and atomic-scale features on the
surface of a sample can be accurately measured in a noncontact mode. Feedback …

Multimode Control in Tapping-Mode AFM: Enabling Imaging on Higher Flexural Eigenmodes

MG Ruppert, SOR Moheimani - IEEE Transactions on Control …, 2015 - ieeexplore.ieee.org
Numerous dynamic atomic force micros-copy (AFM) methods have appeared in recent
years, which make use of the excitation and detection of higher order eigenmodes of the …

Probing attractive forces at the nanoscale using higher-harmonic dynamic force microscopy

S Crittenden, A Raman, R Reifenberger - Physical Review B—Condensed …, 2005 - APS
We systematically investigate higher harmonics in the vibration spectrum of scanning force
microscope cantilevers operating in the attractive regime. We show that (a) the magnitudes …