Thin films of (TeO2)1−x(In2O3)x as gamma radiation sensors
K Arshak, O Korostynska - Sensor Review, 2003 - emerald.com
Thin films of tellurium dioxide (TeO2) and indium oxide (In2O3) mixtures were investigated
for γ‐radiation dosimetry purpose. Samples were fabricated using thermal vacuum …
for γ‐radiation dosimetry purpose. Samples were fabricated using thermal vacuum …
Transport mechanism in mica and SiO2 dielectrics
P Pipinys, V Lapeika, A Rimeika - physica status solidi (b), 2005 - Wiley Online Library
The current–voltage (I–V) characteristics in mica have been measured at different
temperatures. The I–V characteristics possessed a temperature dependence, which was …
temperatures. The I–V characteristics possessed a temperature dependence, which was …
Electroforming in MIM structure of SiOx and SiOx/SnO composite dielectric thin films
GA Khan, CA Hogarth - Journal of materials science, 1992 - Springer
Electroforming and related phenomena in SiO x and SiO x-SnO thin films incorporated in
copper-oxide-copper metal-insulator-metal structures have been investigated. Both types of …
copper-oxide-copper metal-insulator-metal structures have been investigated. Both types of …
Electrical properties of thin films of SiO/In203
ZT AL-DHHAN, J YOUNKI… - International journal of …, 1989 - Taylor & Francis
Electrical measurements on thin films of SiO/In2O3 are reported. The current Ic for DC
conduction in thin film sandwich structures (MIM, metal-insulator-metal) is found to obey a …
conduction in thin film sandwich structures (MIM, metal-insulator-metal) is found to obey a …