In this community review report, we discuss applications and techniques for fast machine
learning (ML) in science—the concept of integrating powerful ML methods into the real-time …

The current status and future prospects of non‐contact atomic force microscopy (nc‐AFM)
and Kelvin probe force microscopy (KPFM) for studying insulating surfaces and thin …

Scanning probe microscopy (SPM) allows the spatial imaging, measurement, and
manipulation of nano and atomic scale surfaces in real space. In the last two decades …

Mechanical and tribological properties of titanium nitride, zirconium nitride, and (TiN/ZrN) n
multilayers were studied to examine the potential of Kelvin probe force microscopy (KPFM) …

Research about two-dimensional (2D) materials is growing exponentially across various
scientific and engineering disciplines due to the wealth of unusual physical phenomena that …

State‐of‐the‐art scanning probe microscopy (SPM) methods as applied to energy
conversion and storage devices, specifically lithium‐ion batteries, are reviewed with an …

We demonstrate the application of scattering-type scanning near-field optical microscopy (s-
SNOM) for infrared (IR) spectroscopic material recognition in state-of-the-art semiconductor …

Due to the attraction of fabricating highly efficient tandem solar cells, wide‐bandgap
perovskite solar cells (PSCs) have attracted substantial interest in recent years. However …

In this study, local cyclic changes of surface topography, phase and volume of TiO2 anode
within an all-solid-state thin film Li-ion battery (TiO2/LiPON/LiNi1/3Co1/3Mn1/3O2) at …

A scanning surface potential measurement technique suited for thin-film devices operating
under high voltages is reported. A commercial atomic force microscope has been …