R Wang, H Ao, JF Yan, Y Liu - AIP Advances, 2024 - pubs.aip.org
Through XRD analysis and xrayutilities fitting, this paper investigates the structural parameters of Al x Ga 1− x N (AlGaN) epitaxial layers grown on both free-standing GaN (FS …
High-quality, thick III-nitride epitaxial drift layers with controlled doping are needed for next- generation highly efficient vertical power devices for a smart grid applications and …