Layout hotpot detection is one of the critical steps in modern integrated circuit design flow. It
aims to find potential weak points in layouts before feeding them into manufacturing stage …

Layout hotpot detection is one of the main steps in modern very-large-scale-integration
(VLSI) chip design. A typical hotspot detection flow is extremely time consuming due to the …

This study presents a non-invasive technique for detecting localized heating and quantifying
the area of hotspots, which are a potential cause of degradation in photovoltaic system …

Layout pattern classification has been recently utilized in IC design. It clusters hotspot
patterns for design-space analysis or yield optimization. In pattern classification, an optimal …

With the continuous shrinking of feature size, detection of lithography hotspots has been
raised as one of the major concerns in Design-for-Manufacturability (DFM) of semiconductor …

To successfully transfer design patterns to wafer, it is essential to calibrate different types of
models to describe the optical, physical, and chemical effects in chip manufacturing process …

Layout features become highly susceptible to lithography process fluctuations due to the
widening subwavelength lithography gap. Problematic layout patterns incur poor printability …

Since the number of hotspot patterns detected on a layout using machine learning technique
is very large, it takes designers a lot of time to classify these hotspot patterns for subsequent …

With the ongoing reduction of feature size, design for manufacturability is a critical concern
in advanced technology nodes. Pattern classification is a promising and widely employed …

In global routing, both timing and routability are critical criteria to measure the performance
of a design. However, these two objectives naturally conflict with each other during routing …