Microscopic theory of nanostructured semiconductor devices: beyond the envelope-function approximation

A Di Carlo - Semiconductor Science and Technology, 2002 - iopscience.iop.org
Modern electronic and optoelectronic devices are approaching nanometric dimensions
where microscopic details cannot be treated in an effective way. Atomistic approaches …

[HTML][HTML] Quantum confinement in Si and Ge nanostructures: Theory and experiment

EG Barbagiovanni, DJ Lockwood, PJ Simpson… - Applied Physics …, 2014 - pubs.aip.org
The role of quantum confinement (QC) in Si and Ge nanostructures (NSs) including quantum
dots, quantum wires, and quantum wells is assessed under a wide variety of fabrication …

Theory of atomic-scale dielectric permittivity at insulator interfaces

F Giustino, A Pasquarello - Physical Review B—Condensed Matter and …, 2005 - APS
We develop a theory for investigating atomic-scale dielectric permittivity profiles across
interfaces between insulators. A local susceptibility χ (x; ω) is introduced to describe …

Atomic-scale dielectric permittivity profiles in slabs and multilayers

N Shi, R Ramprasad - Physical Review B—Condensed Matter and Materials …, 2006 - APS
A recently developed theory of atomic-scale local dielectric permittivity has been used to
determine the position dependent permittivity profiles of a few nanoscale insulator surfaces …

Optical properties of structurally relaxed superlattices: The role of bonding at interfaces

P Carrier, LJ Lewis, MWC Dharma-Wardana - Physical Review B, 2002 - APS
We have constructed microscopic, structurally relaxed atomistic models of Si/SiO 2
superlattices. The structural distortion and oxidation-state characteristics of the interface Si …

Clear quantum-confined luminescence from crystalline silicon/SiO2 single quantum wells

EC Cho, MA Green, J Xia, R Corkish, P Reece… - Applied Physics …, 2004 - pubs.aip.org
Crystalline silicon single quantum wells QWs were fabricated by high-temperature thermal
oxidation of ELTRAN® Epitaxial Layer TRANsfer silicon-on-insulator SOI wafers. The Si …

Local properties at interfaces in nanodielectrics: An ab initio computational study

N Shi, R Ramprasad - IEEE transactions on dielectrics and …, 2008 - ieeexplore.ieee.org
First-principles computational methodologies are presented to study the impact of surfaces
and interfaces on the dielectric and electronic properties of emerging technologically …

Electronic and dielectric properties of a suboxide interlayer at the silicon–oxide interface in MOS devices

F Giustino, A Pasquarello - Surface science, 2005 - Elsevier
We study the electronic structure and the dielectric permittivity of ultrathin oxide layers on Si
(100) substrates. By considering two different Si (100)–SiO2 interface models, we first show …

Dielectric effect of a thin SiO2 interlayer at the interface between silicon and high-k oxides

F Giustino, P Umari, A Pasquarello - Microelectronic engineering, 2004 - Elsevier
We investigate the dielectric permittivity of SiO2 on Si (100) substrates using a first-principles
approach. It is shown that both the static and high-frequency dielectric constants of the oxide …

Computational design of interfaces: Stress and strain on the atomic scale

A Korkin, JC Greer, G Bersuker, VV Karasiev… - Physical Review B …, 2006 - APS
In this paper, we present results of a comparative computational study of silicon oxide
interfaces with (100),(111), and (110) silicon surfaces. Density functional theory (DFT) in the …