UV–vis spectrometry is widely used in the pharmaceutical sciences for compound
quantification, alone or in conjunction with separation techniques, due to most drug entities …

There is an invisible enemy that constantly threatens the operation of electronics: ionizing
radiation. From sea level to outer space, ionizing radiation is virtually everywhere. At sea …

The combining microelectronic devices and associated technologies onto a single silicon
chip poses a substantial challenge. However, in recent years, the area of silicon photonics …

The impact of hydrocarbon-molecular (C3H6)-ion implantation in an epitaxial layer, which
has low oxygen concentration, on the dark characteristics of complementary metal-oxide …

In this paper, the influences of the depth and width of the oxide trench isolation between
pixels, pixel epitaxial layer thickness for different impurity doping concentrations, and light …

In the context of More than Moore (MtM), an overview is given of optical detectors that are
either commercially available today or in advanced development. Focus is placed on the …

Advanced heterogeneous integration involves the stacking of multiple devices using direct
bond interconnect processes to achieve improved functionality. Typical fabrication …

Image sensors used in current machine vision systems suffer from low dynamic range and
poor colour constancy and are brittle and unmalleable, limiting their use in applications for …

We fabricated Al/Al 2 O 3/SiO 2/Si and Al/HfO 2/Si structures to optimize the passivation
layer of a backside-illuminated (BSI) complementary metal oxide semiconductor (CMOS) …

We present a systematic characterization of wafer-level reliability dedicated test structures in
Back-Side-Illuminated CMOS Image Sensors. Noise and electrical measurements …