We propose a false-path-aware statistical timing analysis framework. In our framework, cell
as well as interconnect delays are assumed to be correlated random variables. Our tool can …

What would it take to reduce speed binning's dependency on functional testing? One
answer is a structural at-speed test approach that can achieve the same effectiveness as …

Critical path selection is an indispensable step for testing of small-size delay defects.
Historically, this step relies on the construction of a set of worst-case paths, where the timing …

Under manufacturing process variation, a path through a net is called longest if there exists
a process condition under which the path has the maximum delay among all paths through …

Transistor aging results in circuit delay degradation over time, and is a growing concern for
future systems. On-line circuit failure prediction, together with on-line self-test, can overcome …

The performance of deep submicron designs can be affected by various parametric
variations, manufacturing defects, noise or modeling errors that are all statistical in nature. In …

The performance of deep sub-micron designs can be affected by various parametric
variations, manufacturing defects, noise or even modeling errors that are all statistical in …

Testing the critical paths in a circuit is essential to cover distributed delay and small delay
defects in a manufactured circuit. However, in most circuits, only a small percentage of …

Increasing process variations result in increasing statistical diversity in manufactured
devices. Test plans that are developed without this diversity in mind are bound to result in …

In current industrial practice, critical path selection is an indispensable step for AC delay test
and timing validation. Traditionally, this step relies on the construction of a set of worse-case …