Impact of GSG probe to pads contact repeatability for on-wafer RF measurements
C Mokhtari, M Sebbache, V Avramovic… - 2021 IEEE 7th …, 2021 - ieeexplore.ieee.org
Improving the contact repeatability for on-wafer measurements is required to address
accurate characterization of microwave and millimeter-wave extreme impedance devices …
accurate characterization of microwave and millimeter-wave extreme impedance devices …
New Generation of On-Wafer Microwave Probe Station for Precision GSG Probing
C Mokhtari, M Sebbache, CM Lenoir… - 2022 24th …, 2022 - ieeexplore.ieee.org
Accurate characterization of emergent RF extreme impedance micro-and nanoelectronic
devices requires novel probing techniques to ensure the probe-to-pad contact repeatability …
devices requires novel probing techniques to ensure the probe-to-pad contact repeatability …
Near-field scanning millimeter-wave microscope operating inside a scanning electron microscope: towards quantitative electrical nanocharacterization
P Polovodov, D Théron, C Lenoir, D Deresmes… - Applied Sciences, 2021 - mdpi.com
The main objectives of this work are the development of fundamental extensions to existing
scanning microwave microscopy (SMM) technology to achieve quantitative complex …
scanning microwave microscopy (SMM) technology to achieve quantitative complex …
Nanorobotic Integration with Millimeter-Waves: Advancing Precise Free-Space Sensing
N Alsaleh, D Pomorski, M Sebbache… - 2024 25th …, 2024 - ieeexplore.ieee.org
This work proposes a novel approach to advance non-contact millimeter-wave sensing
capabilities through the fusion of microwave characterization techniques with nanorobotics …
capabilities through the fusion of microwave characterization techniques with nanorobotics …
Operation of near-field scanning millimeter-wave microscopy up to 67 GHz under scanning electron microscopy vision
P Polovodov, D Théron, S Eliet… - 2020 IEEE/MTT-S …, 2020 - ieeexplore.ieee.org
A near-field scanning millimeter-wave microscope is developed with broadband capabilities
up to 67 GHz. The instrumentation has been designed to operate inside a scanning electron …
up to 67 GHz. The instrumentation has been designed to operate inside a scanning electron …
Analysis of device properties of silicon nitride membrane nanoelectromechanical resonators for future optomechanical thermometry applications
H Xu - 2023 - theses.hal.science
Micro-nano-electromechanical resonators play a more and more important role in various
domains, such as sensing, high frequency communications, and even in fundamental …
domains, such as sensing, high frequency communications, and even in fundamental …
Building a near-field scanning millimeter-wave microscope integrated in a scanning electron microscope
P Polovodov, O Haenssler, D Theron… - … , and Robotics at Small …, 2019 - hal.science
A near-field scanning millimeter-wave frequency microscope built inside a scanning electron
microscope is described. The proposed instrumentation can provide simultaneous atomic …
microscope is described. The proposed instrumentation can provide simultaneous atomic …
Electromagnetic Modeling in Near-Field Scanning Microwave Microscopy Highlighting Limitations in Spatial and Electrical Resolutions
P Polovodov, C Brillard, OC Haenssler… - 2018 IEEE MTT-S …, 2018 - ieeexplore.ieee.org
Near-field scanning microwave microscopy (NSMM) is a scanning probe microscopy (SPM)
technique that measures the local interaction of evanescent microwaves with a sample …
technique that measures the local interaction of evanescent microwaves with a sample …