Secondary ion mass spectrometry: characterizing complex samples in two and three dimensions

JS Fletcher, JC Vickerman - Analytical chemistry, 2013 - ACS Publications
Over the last 10 or so years, developments in molecular se-condary ion mass spectrometry
(SIMS) have taken its capability into areas previously only demonstrated in dynamic SIMS …

Gas cluster ion beams for secondary ion mass spectrometry

N Winograd - Annual review of analytical chemistry, 2018 - annualreviews.org
Gas cluster ion beams (GCIBs) provide new opportunities for bioimaging and molecular
depth profiling with secondary ion mass spectrometry (SIMS). These beams, consisting of …

Universal equation for argon gas cluster sputtering yields

MP Seah - The Journal of Physical Chemistry C, 2013 - ACS Publications
An analysis is made of the sputtering yields of materials for argon gas cluster ion beams
used in SIMS and XPS as a function of the beam energy, E, and the cluster size, n. The …

Organic depth profiling of a nanostructured delta layer reference material using large argon cluster ions

JLS Lee, S Ninomiya, J Matsuo, IS Gilmore… - Analytical …, 2010 - ACS Publications
Cluster ion beams have revolutionized the analysis of organic surfaces in time-of-flight
secondary ion mass spectrometry and opened up new capabilities for organic depth …

Large cluster ions: soft local probes and tools for organic and bio surfaces

A Delcorte, V Delmez, C Dupont-Gillain… - Physical Chemistry …, 2020 - pubs.rsc.org
Ionised cluster beams have been produced and employed for thin film deposition and
surface processing for half a century. In the last two decades, kiloelectronvolt cluster ions …

Enhancing ion yields in time-of-flight-secondary ion mass spectrometry: a comparative study of argon and water cluster primary beams

S Sheraz née Rabbani, I Berrueta Razo… - Analytical …, 2015 - ACS Publications
Following from our previous Letter on this topic, this Article reports a detailed study of time-of-
flight-secondary ion mass spectrometry (TOF-SIMS) positive ion spectra generated from a …

Enhanced ion yields using high energy water cluster beams for secondary ion mass spectrometry analysis and imaging

S Sheraz, H Tian, JC Vickerman… - Analytical …, 2019 - ACS Publications
Previous studies have shown that the use of a 20 keV water cluster beam as a primary beam
for the analysis of organic and bio-organic systems resulted in a 10–100 times increase in …

Reactive molecular dynamics simulations of lysozyme desorption under Ar cluster impact

S Bertolini, A Delcorte - Applied Surface Science, 2023 - Elsevier
Using large gas cluster ion beams (Ar 1000-5000+), it is possible to desorb and transfer non-
volatile and active biomolecules (eg lysozymes, 14 kDa) for nanofabrication or mass …

How to detect life on icy moons

MA Sephton, JH Waite, TG Brockwell - Astrobiology, 2018 - liebertpub.com
The icy moons of the outer Solar System present the possibility of subsurface water,
habitable conditions, and potential abodes for life. Access to evidence that reveals the …

Accurate argon cluster-ion sputter yields: Measured yields and effect of the sputter threshold in practical depth-profiling by x-ray photoelectron spectroscopy and …

PJ Cumpson, JF Portoles, AJ Barlow… - Journal of Applied …, 2013 - pubs.aip.org
Argon Gas Cluster-Ion Beam sources are likely to become widely used on x-ray
photoelectron spectroscopy and secondary ion mass spectrometry instruments in the next …