CF Chang, JY Chen, GM Huang, TY Lin,
KL Tai… - Nano Energy, 2018 - Elsevier
In this work, we used the polycrystalline-Fe 3 O 4 to improve the reliability of the Ag/Ta 2 O
5/Pt resistive random access memory (RRAM). In both the Ag/Ta 2 O 5/Fe 3 O 4/Pt and …