Conventional techniques that measure the concentration of light elements in metallic
materials lack high-resolution performance due to their intrinsic limitation of sensitivity. In …

In this work, microwave characterization of magnetic materials using the scanning
microwave microscopy (SMM) technique is presented. The capabilities of the SMM are …

We have demonstrated the capabilities of the scanning microwave microscopy (SMM)
technique for measuring ferromagnetic resonance (FMR) spectra in nanometric areas of …

A quantitative approach is used to determine an effective height of probe beyond which the
capacitance contribution is not significant in microwave impedance microscopy (MIM). We …

This work details an effective dynamic chemical etching technique to fabricate ultra-sharp
tips for Scanning Near-Field Microwave Microscopy (SNMM). The protruded cylindrical part …

Scanning near-field microwave microscopy is a versatile tool to image the surface of
materials, with sub-wavelength spatial resolution, in terms of the impedance at microwave …

In this work, an electromagnetic technique for imaging and spectroscopy of materials and
devices, suitable for the characterization of MEMS and microelectronics configurations as a …

In this paper, the basic principles of Near-Field Microscopy will be reviewed with focus on
the micro-and nano-scale resolution configurations for material science measurements …