In this work, microwave characterization of magnetic materials using the scanning microwave microscopy (SMM) technique is presented. The capabilities of the SMM are …
We have demonstrated the capabilities of the scanning microwave microscopy (SMM) technique for measuring ferromagnetic resonance (FMR) spectra in nanometric areas of …
A quantitative approach is used to determine an effective height of probe beyond which the capacitance contribution is not significant in microwave impedance microscopy (MIM). We …
This work details an effective dynamic chemical etching technique to fabricate ultra-sharp tips for Scanning Near-Field Microwave Microscopy (SNMM). The protruded cylindrical part …
Scanning near-field microwave microscopy is a versatile tool to image the surface of materials, with sub-wavelength spatial resolution, in terms of the impedance at microwave …
In this work, an electromagnetic technique for imaging and spectroscopy of materials and devices, suitable for the characterization of MEMS and microelectronics configurations as a …
In this paper, the basic principles of Near-Field Microscopy will be reviewed with focus on the micro-and nano-scale resolution configurations for material science measurements …