Lithography hotspot detection: From shallow to deep learning

H Yang, Y Lin, B Yu, EFY Young - 2017 30th IEEE International …, 2017 - ieeexplore.ieee.org
As VLSI technology nodes continue, the gap between lithography system manufacturing
ability and transistor feature size induces serious problems, thus lithography hotspot …

ePlace-3D: Electrostatics based placement for 3D-ICs

J Lu, H Zhuang, I Kang, P Chen… - Proceedings of the 2016 on …, 2016 - dl.acm.org
We propose a flat, analytic, mixed-size placement algorithm ePlace-3D for three-dimension
integrated circuits (3D-ICs) using nonlinear optimization. Our contributions are (1) …

Design-phase buffer allocation for post-silicon clock binning by iterative learning

GL Zhang, B Li, J Liu, Y Shi… - IEEE Transactions on …, 2017 - ieeexplore.ieee.org
At submicrometer manufacturing technology nodes, process variations affect circuit
performance significantly. To counter these variations, engineers are reserving more timing …

Accelerating chip design with machine learning: From pre-silicon to post-silicon

C Zhuo, B Yu, D Gao - 2017 30th IEEE International System-on …, 2017 - ieeexplore.ieee.org
At sub-22nm regime, chip designs have to go through hundreds to thousands of steps and
tasks before shipment. Many tasks are data and simulation intensive, thereby demanding …

Generative adversarial network based scalable on-chip noise sensor placement

J Liu, Y Ding, J Yang… - 2017 30th IEEE …, 2017 - ieeexplore.ieee.org
The relentless efforts towards power reduction of integrated circuits have led to the
prevalence of near-threshold computing paradigms. With the significantly reduced noise …

Power management for multicore processors via heterogeneous voltage regulation and machine learning enabled adaptation

X Zhan, J Chen… - IEEE Transactions on …, 2019 - ieeexplore.ieee.org
This work is based on the vision that the ultimate power integrity and efficiency may be best
achieved via a heterogeneous chain of voltage processing starting from onboard switching …

Machine learning for noise sensor placement and full-chip voltage emergency detection

X Liu, S Sun, X Li, H Qian… - IEEE Transactions on …, 2016 - ieeexplore.ieee.org
Power supply fluctuation can be potential threat to the correct operations of processors, in
the form of voltage emergency that happens when supply voltage drops below a certain …

A statistical methodology for noise sensor placement and full-chip voltage map generation

X Liu, S Sun, P Zhou, X Li, H Qian - Proceedings of the 52nd Annual …, 2015 - dl.acm.org
Noise margin violation, also known as voltage emergency induced by continuously reducing
noise margin and increasing magnitude of current swings, is becoming a severe threat to the …

On the deployment of on-chip noise sensors

T Wang, C Zhang, J Xiong, Y Shi - IEEE Transactions on …, 2014 - ieeexplore.ieee.org
Runtime noise management systems can enforce power integrity without significantly
increasing design margins. These systems typically respond to on-chip noise sensors to …

Full-Chip Voltage Prediction via Graph Attention Based Neural Networks

Y Li, P Zhou - 2023 IEEE 15th International Conference on …, 2023 - ieeexplore.ieee.org
Power supply noise has been a rising threat to the normal functioning of a microprocessor in
the form of voltage emergence. The state-of-the-art commercial chips detect such …