Microscale characterization of mechanical properties

KJ Hemker, WN Sharpe Jr - Annu. Rev. Mater. Res., 2007 - annualreviews.org
Lilliputian techniques for measuring the mechanical response of microscale specimens are
being developed to characterize the performance and reliability of microelectromechanical …

On the standards and practices for miniaturized tensile test–A review

P Zheng, R Chen, H Liu, J Chen, Z Zhang, X Liu… - Fusion Engineering and …, 2020 - Elsevier
Abstract Miniaturized Tensile Test (MTT), as an important type of Small Specimen Test
Technology (SSTT), has gained increasing attentions in the nuclear industry and other …

[图书][B] Foundations of nanomechanics: from solid-state theory to device applications

AN Cleland - 2013 - books.google.com
Why write another book on mechanics? There are, after all, a number of excellent texts that
describe in great detail the way classical solids behave when acted upon by static and time …

Specimen size effect on tensile strength of surface-micromachined polycrystalline silicon thin films

T Tsuchiya, O Tabata, J Sakata… - Journal of …, 1998 - ieeexplore.ieee.org
A new tensile tester using an electrostatic-force grip was developed to evaluate the tensile
strength and the reliability of thin-film materials. The tester was constructed in a scanning …

Measurements of Young's modulus, Poisson's ratio, and tensile strength of polysilicon

WN Sharpe, B Yuan, R Vaidyanathan… - Proceedings IEEE the …, 1997 - ieeexplore.ieee.org
New techniques and procedures are described that enable one to measure the mechanical
properties of polysilicon films that are 3.5/spl mu/m thick. Polysilicon is deposited onto a …

[图书][B] Optical inspection of Microsystems

W Osten, A Duparre, C Furlong, I De Wolf, A Asundi… - 2018 - taylorfrancis.com
Where conventional testing and inspection techniques fail at the micro-scale, optical
techniques provide a fast, robust, and relatively inexpensive alternative for investigating the …

[PDF][PDF] Electrostatic pull-in test structure design for in-situ mechanical property measurements of microelectromechanical systems (MEMS)

RK Gupta - 1997 - dspace.mit.edu
M-TEST, an electrostatic pull-in approach for the in-situ mechanical property measurements
of microelectromechanical systems (MEMS), is used to extract the Young's modulus and …

Measurement of mechanical properties for MEMS materials

T Yi, CJ Kim - Measurement Science and Technology, 1999 - iopscience.iop.org
The microscopic mechanical devices in microelectromechanical systems (MEMS) use
materials such as silicon and many other thin films, which had not previously been …

Effect of specimen size on Young's modulus and fracture strength of polysilicon

WN Sharpe, KM Jackson, KJ Hemker… - Journal of …, 2001 - ieeexplore.ieee.org
The microstructure of polysilicon specimens of varying size was examined and tensile tests
were conducted to determine if the measured modulus and strength depend on the size of …

Miniaturized single-crystalline fcc metals deformed in tension: New insights in size-dependent plasticity

G Dehm - Progress in Materials Science, 2009 - Elsevier
The continuing trend of miniaturizing materials in many modern technological applications
has led to a strong demand for understanding the complex mechanical properties of …