Extreme-ultraviolet light source for lithography based on an expanding jet of dense xenon plasma supported by microwaves

IS Abramov, ED Gospodchikov, AG Shalashov - Physical Review Applied, 2018 - APS
We discuss a concept of a pointlike source of extreme-ultraviolet (EUV) light based on a
nonequilibrium microwave discharge in an expanding jet of dense xenon plasma with …

Observation of extreme ultraviolet light emission from an expanding plasma jet with multiply charged argon or xenon ions

AG Shalashov, AV Vodopyanov, IS Abramov… - Applied Physics …, 2018 - pubs.aip.org
We report on the first direct demonstration of the possibility to generate extreme ultraviolet
(EUV) radiation with a freely expanding jet of dense plasma with multiply charged ions …

13.5 nm extreme ultraviolet emission from tin based laser produced plasma sources

P Hayden, A Cummings, N Murphy… - Journal of applied …, 2006 - pubs.aip.org
An examination of the influence of target composition and viewing angle on the extreme
ultraviolet spectra of laser produced plasmas formed from tin and tin doped planar targets is …

Expansion of laser discharge in xenon jet improves EUV-light emission

IS Abramov, SV Golubev, ED Gospodchikov… - Applied Physics …, 2023 - pubs.aip.org
We consider a laser discharge in xenon jet as a source of extreme ultraviolet (EUV)-light. For
realistic plasma parameters, it is shown that the plasma with multiply charged ions, initially …

Analysis of the spectra of In XII–XIV and Sn XIII–XV in the far-VUV region

SS Churilov, AN Ryabtsev - Optics and spectroscopy, 2006 - Springer
Abstract The 4 p 6 4 d−(4 p 6 5 p+ 4 p 6 4 f+ 4 p 5 4 d 2) transitions in the spectra of In XIII-Sn
XIV and the 4 p 6 4 d 2−(4 p 6 4 d 5 p+ 4 p 6 4 d 4 f+ 4 p 5 4 d 3) transitions in the spectra of …

Extreme ultraviolet emission spectra of highly ionized xenon and their comparison with model calculations

N Böwering, M Martins, WN Partlo… - Journal of applied …, 2004 - pubs.aip.org
Xenon spectra involving emission from ion species of Xe7 to Xe12 were analyzed for a
plasma focus discharge developed for extreme ultraviolet lithography. Low and higher …

Extreme-ultraviolet spectroscopy of highly charged xenon ions created using an electron-beam ion trap

K Fahy, E Sokell, G O'Sullivan, A Aguilar… - Physical Review A …, 2007 - APS
Extreme-ultraviolet spectra of xenon ions have been recorded in the 4.5 to 20 nm
wavelength region using an electron beam ion trap and a flat field spectrometer. The …

High-resolution spectrum of xenon ions at 13.4 nm

S Churilov, YN Joshi, J Reader - Optics letters, 2003 - opg.optica.org
The spectrum of xenon excited in a low-inductance vacuum spark was photographed at high
resolution in the region of 9.5–15.5 nm. The observed transitions were identified as …

A high efficiency ultrahigh vacuum compatible flat field spectrometer for extreme ultraviolet wavelengths

B Blagojević, EO Le Bigot, K Fahy, A Aguilar… - Review of scientific …, 2005 - pubs.aip.org
A custom, flat field, extreme ultraviolet spectrometer built specifically for use with low power
light sources that operate under ultrahigh vacuum conditions is reported. The spectral range …

4p64d8–(4d75p+ 4d74f+ 4p54d9) Transitions in Xe XI

SS Churilov, YN Joshi, J Reader… - Physica Scripta, 2004 - iopscience.iop.org
The spectrum of ten times ionized xenon, Xe XI, was observed in the region 105–157 Å with
a low-inductance vacuum spark and a 10.7 m grazing-incidence spectrograph. About 200 …