On the strong coupling of polarization and charge trapping in HfO2/Si-based ferroelectric field-effect transistors: overview of device operation and reliability

K Toprasertpong, M Takenaka, S Takagi - Applied Physics A, 2022 - Springer
Ferroelectric field-effect transistors (FeFETs) have become an attractive technology for
memory and emerging applications on a silicon electronic platform after the discovery of the …

Ferroelectricity of hafnium oxide-based materials: Current status and future prospects from physical mechanisms to device applications

W Yang, C Yu, H Li, M Fan, X Song, H Ma… - Journal of …, 2023 - iopscience.iop.org
The finding of the robust ferroelectricity in HfO 2-based thin films is fantastic from the view
point of both the fundamentals and the applications. In this review article, the current …

Impact of saturated spontaneous polarization on the endurance fatigue of Si FeFET with metal/ferroelectric/interlayer/Si gate structure

M Liao, H Xu, J Duan, S Zhao, F Tian… - … on Electron Devices, 2023 - ieeexplore.ieee.org
We investigate the impact of saturated spontaneous polarization (of the ferroelectric on
endurance fatigue of Si FeFET with Metal/Ferroelectric/Interlayer/Si (MFIS) gate structure …

Phase-field simulations of polarization variations in polycrystalline Hf0. 5Zr0. 5O2 based MFIM: Voltage dependence and dynamics

R Koduru, I Ahmed, AK Saha, X Lyu, P Ye… - Journal of Applied …, 2023 - pubs.aip.org
In this work, we investigate the device-to-device variations in the remanent polarization of
metal–ferroelectric–insulator–metal stacks based on ferroelectric hafnium–zirconium–oxide …

Disturb and its mitigation in Ferroelectric Field-Effect Transistors with Large Memory Window for NAND Flash Applications

P Venkatesan, C Park, T Song… - IEEE Electron …, 2024 - ieeexplore.ieee.org
We study the disturb characteristics of ferroelectric field-effect transistors (FEFETs) with band-
engineered gate stacks. We demonstrate that integrating a dielectric Al2O3 layer within the …

Plasma-Enhanced Atomic Layer Deposition Based Ferroelectric Field-Effect Transistors

C Park, PV Ravindran, D Das… - IEEE Journal of the …, 2024 - ieeexplore.ieee.org
The use of the plasma-enhanced atomic layer deposition (ALD) technique for the deposition
of HfO2-based ferroelectrics has received attention in recent years primarily due to wake-up …

A Novel Ferroelectric MemCapacitor Enabling Multilevel Operation

D Lizzit, M Segatto, D Esseni - IEEE Transactions on Electron …, 2025 - ieeexplore.ieee.org
The progress of biologically inspired neuromorphic computing hardware in the last decade
has been fostered also by the advancement in CMOS-compatible memristors, providing a …

Origin of charges in bulk Si: HfO2 FeFET probed by nanosecond polarization measurements

MM Dahan, H Mulaosmanovic, O Levit, S Dünkel… - Microelectronic …, 2025 - Elsevier
FeFET technology offers the potential for fast, energy-efficient, low-cost, and high-capacity
non-volatile memory and neuromorphic devices. However, charge trapping significantly …

Can interface layer be really free for HfxZr1-xO2 based ferroelectric field-effect transistors with oxide semiconductor channel?

T Cui, D Chen, Y Dong, Y Fan, Z Yao… - IEEE Electron …, 2024 - ieeexplore.ieee.org
The HfxZr1− xO2 (HZO) based ferroelectric field-effect transistors (FeFETs) with oxide
semiconductor channel have been proposed to have the potential of interface layer (IL) free …

Immediate read-after-write capability in p-type ferroelectric field-effect transistors and its evolution with fatigue cycling

N Tasneem, Z Wang, H Chen, S Yu… - … on Device and …, 2023 - ieeexplore.ieee.org
P-type ferroelectric field-effect transistors (p-FEFETs) are of significant interest due to recent
reports on their immediate read-after-write capability (unlike their n-type counterparts), which …