[图书][B] VLSI test principles and architectures: design for testability

LT Wang, CW Wu, X Wen - 2006 - books.google.com
This book is a comprehensive guide to new DFT methods that will show the readers how to
design a testable and quality product, drive down test cost, improve product quality and …

[图书][B] Electronic design automation: synthesis, verification, and test

LT Wang, YW Chang, KTT Cheng - 2009 - books.google.com
This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI
practitioners and researchers in need of fluency in an" adjacent" field will find this an …

Method and user interface for debugging an electronic system

NE Schubert, JM Beardslee, GH Koch… - US Patent …, 2004 - Google Patents
Continuation-in-part of application No. 09/724,840, filed on Nov. 28, 2000, now Pat. No.
6,618,839, application No. 10/210,509. Provisional application No. 60/168.266, filed on Nov …

Hardware/software co-debugging in a hardware description language

NE Schubert, KS McElvain, JM Beardslee… - US Patent …, 2007 - Google Patents
Techniques and systems for analysis, diagnosis and debugging fabricated hardware
designs at a Hardware Description Language (HDL) level are described. Although the …

Method and user interface for debugging an electronic system

NE Schubert, JM Beardslee, GH Koch… - US Patent …, 2008 - Google Patents
Techniques and systems for analysis, diagnosis and debugging fabricated hardware
designs at a Hardware Description Language (HDL) level are described. Although the …

Method and system for debugging an electronic system using instrumentation circuitry and a logic analyzer

NE Schubert, JM Beardslee, GH Koch… - US Patent …, 2006 - Google Patents
Techniques and systems for analysis, diagnosis and debugging fabricated hardware
designs at a Hardware Description Language (HDL) level are described. Although the …

Enhanced hardware debugging with embedded FPGAS in a hardware description language

NE Schubert, KS McElvain, JM Beardslee… - US Patent …, 2010 - Google Patents
5,771,240 A 6/1998 Tobin et a1. 5,809,037 A 9/1998 Mathewson in integrated circuit
products with limited input/output pins, the techniques and systems enable the hardware …

Sequential equivalence checking for asynchronous verification

JR Baumgartner, Y Ja, H Mony, V Paruthi… - US Patent …, 2011 - Google Patents
Mechanisms for performing sequential equivalence checking for asynchronous verification
are provided. A first model of the integrated circuit design is provided that has additional …

Smart capture for ATPG (automatic test pattern generation) and fault simulation of scan-based integrated circuits

LT Wang, KS Abdel-Hafez, X Wen, BJ Sheu… - US Patent …, 2006 - Google Patents
A method for generating stimuli and test responses for testing faults in a scan-based
integrated circuit in a selected scan-test mode or a selected self-test mode, the scan-based …

System and method of replacing flip-flops with pulsed latches in circuit designs

HC Li, MC Chen, K Ho - US Patent 7,694,242, 2010 - Google Patents
A circuit design system, methodology, and software are disclosed for generating circuit
capable of consuming less dynamic power. In particular, the circuit design methodology …