Testability and dependability of AI hardware: Survey, trends, challenges, and perspectives

F Su, C Liu, HG Stratigopoulos - IEEE Design & Test, 2023 - ieeexplore.ieee.org
Hardware realization of artificial intelligence (AI) requires new design styles and even
underlying technologies than those used in traditional digital processors or logic circuits …

A systematic literature review on hardware reliability assessment methods for deep neural networks

MH Ahmadilivani, M Taheri, J Raik… - ACM Computing …, 2024 - dl.acm.org
Artificial Intelligence (AI) and, in particular, Machine Learning (ML), have emerged to be
utilized in various applications due to their capability to learn how to solve complex …

Design and evaluation of buffered triple modular redundancy in interleaved-multi-threading processors

M Barbirotta, A Cheikh, A Mastrandrea… - IEEE …, 2022 - ieeexplore.ieee.org
Fault management in digital chips is a crucial aspect of functional safety. Significant work
has been done on gate and microarchitecture level triple modular redundancy, and on …

Dynamic triple modular redundancy in interleaved hardware threads: An alternative solution to lockstep multi-cores for fault-tolerant systems

M Barbirotta, F Menichelli, A Cheikh… - IEEE …, 2024 - ieeexplore.ieee.org
Over the years, significant work has been done on high-integrity systems, such as those
found in cars, satellites and aircrafts, to minimize the risk that a logic fault causes a system …

Reliability exploration of system-on-chip with multi-bit-width accelerator for multi-precision deep neural networks

Q Cheng, M Huang, C Man, A Shen… - … on Circuits and …, 2023 - ieeexplore.ieee.org
Deep neural networks (DNNs) in safety-critical applications demand high reliability even
when running on edge-computing devices. Recent works on System-on-Chip (SoC) design …

[HTML][HTML] SOFIA: An automated framework for early soft error assessment, identification, and mitigation

J Gava, V Bandeira, F Rosa, R Garibotti, R Reis… - Journal of Systems …, 2022 - Elsevier
The occurrence of radiation-induced soft errors in electronic computing systems can either
affect non-essential system functionalities or violate safety–critical conditions, which might …

The impact of soft errors in memory units of edge devices executing convolutional neural networks

G Abich, R Garibotti, R Reis… - IEEE Transactions on …, 2022 - ieeexplore.ieee.org
Driven by the success of machine learning algorithms for recognizing and identifying
objects, there are significant efforts to exploit convolutional neural networks (CNNs) in edge …

A lightweight mitigation technique for resource-constrained devices executing dnn inference models under neutron radiation

J Gava, A Hanneman, G Abich… - … on Nuclear Science, 2023 - ieeexplore.ieee.org
Deep neural network (DNN) models are being deployed in safety-critical embedded devices
for object identification, recognition, and even trajectory prediction. Optimized versions of …

Assessment of tiny machine-learning computing systems under neutron-induced radiation effects

RP Bastos, MG Trindade, R Garibotti… - … on Nuclear Science, 2022 - ieeexplore.ieee.org
This article compares and assesses the effectiveness of three prominent machine learning
(ML) models for tiny ML computing systems in tolerating neutron-induced soft errors. Results …

[HTML][HTML] Resilience of deep learning applications: A systematic literature review of analysis and hardening techniques

C Bolchini, L Cassano, A Miele - Computer Science Review, 2024 - Elsevier
Abstract Machine Learning (ML) is currently being exploited in numerous applications, being
one of the most effective Artificial Intelligence (AI) technologies used in diverse fields, such …