The helium ion microscope has emerged as a multifaceted instrument enabling a broad
range of applications beyond imaging in which the finely focused helium ion beam is used …

The focused ion beam (FIB) is a powerful tool for fabrication, modification, and
characterization of materials down to the nanoscale. Starting with the gallium FIB, which was …

Halide perovskites are promising materials for optoelectronics with an attractive radiation
resistance property. In this article, we study the effect of 30 keV Ga+ ion irradiation on the …

Direct bandgap semiconductors possess a unique attribute: the presence of a free exciton
state with a high total oscillator strength. This property makes them highly promising for …

Abstract Systems with a focused ion beam, using gas field ion sources, are described. The
principles of operation and ways of formation of these sources, in which the effective …

In this paper we demonstrate a nanofabrication technique based on local ion irradiation of
silicon dioxide with a focused helium ion beam. The wet etching of silicon dioxide irradiated …

In this paper, a comparative analysis and numerical simulation of operation of two types of
amplitude binary gratings (conventional and fork), both in the focal plane and near-field …

Resonant diffractive optical elements can be used to create the desired spatial and angular
distribution of scattered light in a narrow wavelength range. Exciton resonance could help to …

We investigated the effect of helium ion beam treatment on the etching rate of silicon dioxide
in a water based solution of hydrofluoric acid. A 460-nm-thick silicon dioxide film on silicon …

In this paper, a comparative theoretical analysis and numerical simulation of the operation of
various types of diffraction gratings in the far field is carried out using a Fourier transform. In …