M Stachowicz, JM Sajkowski, MA Pietrzyk,
DN Faye… - Thin Solid Films, 2023 - Elsevier
Rutherford backscattering spectrometry (RBS) was used to determine the composition,
uniformity, impurity, and elemental depth profiles of Zn, Cd, and O in ZnCdO/ZnO thin film …