Statistical Analysis and Optimization For VLSI: Timing and Power is a state-of-the-art book
on the newly emerging field of statistical computer-aided design (CAD) tools. The very latest …

As technology scales, subthreshold leakage currents grow exponentially and become an
increasingly large component of total power dissipation. CAD tools to help model and …

Reducing power dissipation is one of the most important issues in very large scale
integration design today. Scaling causes subthreshold leakage currents to become a large …

In this paper, we present a method for analyzing the leakage current, and hence the leakage
power, of a circuit under process parameter variations that can include spatial correlations …

Reducing power dissipation is one of the most principle subjects in VLSI design today.
Scaling causes subthreshold leakage currents to become a large component of total power …

In this paper we address the growing issue of gate oxide leakage current (I/sub gate/) at the
circuit level. Specifically, we develop a fast approach to analyze the total leakage power of a …

We develop a method to estimate the variation of leakage current due to both intra-die and
inter-die gate length process variability. We derive an analytical expression to estimate the …

The power consumption of integrated circuits is one of the most problematic considerations
affecting the design of high-performance chips and portable devices. The study of power …

Power dissipation is becoming the most challenging design constraint in nanometer
technologies. Among various design implementation schemes, standard cell ASICs offer the …

We describe an optimization strategy for minimizing total power consumption using dual
threshold voltage (Vth) technology. Significant power savings are possible by simultaneous …