Force calibration in lateral force microscopy: a review of the experimental methods

M Munz - Journal of Physics D: Applied Physics, 2010 - iopscience.iop.org
Lateral force microscopy (LFM) is a variation of atomic/scanning force microscopy
(AFM/SFM). It relies on the torsional deformation of the AFM cantilever that results from the …

[图书][B] Atomic force microscopy

P Eaton, P West - 2010 - books.google.com
Atomic force microscopy is an amazing technique that allies a versatile methodology (that
allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented …

[图书][B] Surface and interfacial forces

HJ Butt, M Kappl - 2018 - books.google.com
A general introduction to surface and interfacial forces, perfectly combining theoretical
concepts, experimental techniques and practical applications. In this completely updated …

[PDF][PDF] Atomic force microscopy in cancer cell research

I Sokolov - Cancer nanotechnology, 2007 - researchgate.net
There is no need to describe the importance of studying the problem of cancer. Atomic force
microscopy (AFM) is a novel technique, arising out of and a form of scanning probe …

Normal and torsional spring constants of atomic force microscope cantilevers

CP Green, H Lioe, JP Cleveland, R Proksch… - Review of Scientific …, 2004 - pubs.aip.org
Two methods commonly used to measure the normal spring constants of atomic force
microscope cantilevers are the added mass method of Cleveland et al. JP Cleveland et al …

An improved wedge calibration method for lateral force in atomic force microscopy

M Varenberg, I Etsion, G Halperin - Review of scientific instruments, 2003 - pubs.aip.org
An improved wedge calibration method for quantitative lateral force measurement in atomic
force microscopy is presented. The improved method differs from the original one in several …

Method of surface energy investigation by lateral AFM: Application to control growth mechanism of nanostructured NiFe films

TI Zubar, VM Fedosyuk, SV Trukhanov, DI Tishkevich… - Scientific reports, 2020 - nature.com
A new method for the specific surface energy investigation based on a combination of the
force spectroscopy and the method of nanofriction study using atomic force microscopy was …

[HTML][HTML] Lateral force calibration of an atomic force microscope with a diamagnetic levitation spring system

Q Li, KS Kim, A Rydberg - Review of scientific instruments, 2006 - pubs.aip.org
A novel diamagnetic lateral force calibrator (D-LFC) has been developed to directly calibrate
atomic force microscope (AFM) cantilever-tip or-bead assemblies. This enables an AFM to …

Torsional frequency response of cantilever beams immersed in viscous fluids with applications to the atomic force microscope

CP Green, JE Sader - Journal of applied physics, 2002 - pubs.aip.org
The frequency response of a cantilever beam is strongly dependent on the fluid in which it is
immersed. In a companion study, Sader [J. Appl. Phys. 84, 64,(1998)] presented a …

[引用][C] Medical devices and systems

JD Bronzino - 2006 - books.google.com
Over the last century, medicine has come out of the" black bag" and emerged as one of the
most dynamic and advanced fields of development in science and technology. Today …