Today's manufacturers of high-volume consumer devices are under tremendous cost
pressure and consequently under extreme pressure to reduce cost of test. Low-cost ATE has …

Test approaches that can be combined with multisite, like reduced pin-count test, low
channel cost ATE, and bandwidth matching, are becoming pervasive. Yet their economic …

Embedded test of memory and random logic can enable very low cost ATE to test large, high
speed ICs because high quality at-speed tests can be generated onchip. However, it is also …

Low cost ATE has often been promoted as the obvious solution to reduce the cost of test.
Parallel test is another well-known approach, where multiple devices are tested on one …

Over the last two decades much work has been done to address the needs of women in
science, technology, engineering and mathematics (STEM) areas and to develop …

Multi-site testing is a popular and effective way to increase test throughput and reduce test
costs. The authors pro\pose a test flow with large multi-site testing during wafer test, enabled …

Multi-site testing is a popular and effective way to increase test throughput and reduce test
costs. We present a test throughput model, in which we focus on wafer testing, and consider …

This paper proposes a manufacturing test cost model for systems as they go through a
manufacturing test process. The cost model allows the company to calibrate the test process …

The Multi-Domain-Test is the new test strategy to resolve problems and limitations of the
Multi-Site-Test and the Concurrent-Test. By this novel test strategy, test time can be reduced …

For reducing the test application time and required tester pins per device, we propose the
use of multi-valued logic (MVL) signals, which increases data rate between the device under …