Rationale In Time‐of‐Flight Secondary Ion Mass Spectrometry (TOF‐SIMS), pulsed and
focused primary ion beams enable mass spectrometry imaging, a method which is …

Imaging with time-of-flight secondary ion mass spectrometry (TOF-SIMS) has expanded very
rapidly with the development of gold cluster ion sources (Au 3+). It is now possible to acquire …

Human striated muscle samples, from male control and Duchenne muscular dystrophy-
affected children, were subjected to cluster-time-of-flight secondary ion mass spectrometry …

Energy and angular distributions of sputtered species from a wide variety of target materials
(metals, semiconductors, alkali halides, frozen gases, and organic solids) are discussed …

Emission of secondary clusters off clean solid surfaces following the impact of a projectile
ion at kiloelectronvolt (keV) kinetic energies is important from both practical and fundamental …

The ion sputtering of metals and frozen inert gases in the nonlinear collision cascade
regime, where the density of the energy released in the bulk of the thermal peak exceeds the …

The so-called velocity correlated cluster emission (VCCE) effect is the recently reported
emission of large clusters with nearly the same velocity from an atomically heavy target …

The potential of ion sputtering based mass spectrometry applied to materials
characterization on the nanometer scale is discussed. Analytical approaches and required …

Analytical formulas have been obtained for the energy spectrum F+(E) of atomic ions and
the energy dependence of the degree of ionization α+(E) of atoms sputtered from metals in …

We have measured kinetic energy distributions of Ta n C n+(n= 1–10) and Ag n+(n= 1–9)
cluster ions sputtered off Ta and Ag targets, following impact of C 60− at 14 keV kinetic …