Si–Ge–Sn alloys: From growth to applications

S Wirths, D Buca, S Mantl - Progress in crystal growth and characterization …, 2016 - Elsevier
In this review article, we address key material parameters as well as the fabrication and
application of crystalline GeSn binary and SiGeSn ternary alloys. Here, the transition from an …

Review of Si-based GeSn CVD growth and optoelectronic applications

Y Miao, G Wang, Z Kong, B Xu, X Zhao, X Luo, H Lin… - Nanomaterials, 2021 - mdpi.com
GeSn alloys have already attracted extensive attention due to their excellent properties and
wide-ranging electronic and optoelectronic applications. Both theoretical and experimental …

Germanium CMOS potential from material and process perspectives: Be more positive about germanium

A Toriumi, T Nishimura - Japanese Journal of Applied Physics, 2017 - iopscience.iop.org
CMOS miniaturization is now approaching the sub-10 nm level, and further downscaling is
expected. This size scaling will end sooner or later, however, because the typical size is …

7-nm FinFET CMOS design enabled by stress engineering using Si, Ge, and Sn

S Gupta, V Moroz, L Smith, Q Lu… - IEEE transactions on …, 2014 - ieeexplore.ieee.org
Bandgap and stress engineering using group IV materials-Si, Ge, and Sn, and their alloys
are employed to design a FinFET-based CMOS solution for the 7-nm technology node and …

Material characterization of high Sn-content, compressively-strained GeSn epitaxial films after rapid thermal processing

R Chen, YC Huang, S Gupta, AC Lin, E Sanchez… - Journal of crystal …, 2013 - Elsevier
We report on the characterization of high Sn-content (∼ 10% Sn) GeSn films grown on (001)
Ge/Si substrates using reduced-pressure chemical vapor deposition. Pseudomorphic 30nm …

GeSn lateral pin photodetector on insulating substrate

S Xu, YC Huang, KH Lee, W Wang, Y Dong, D Lei… - Optics express, 2018 - opg.optica.org
We report the first experimental demonstration of germanium-tin (GeSn) lateral pin
photodetector on a novel GeSn-on-insulator (GeSnOI) substrate. The GeSnOI is formed by …

High-k Gate Stacks on Low Bandgap Tensile Strained Ge and GeSn Alloys for Field-Effect Transistors

S Wirths, D Stange, MA Pampillón… - … applied materials & …, 2015 - ACS Publications
We present the epitaxial growth of Ge and Ge0. 94Sn0. 06 layers with 1.4% and 0.4%
tensile strain, respectively, by reduced pressure chemical vapor deposition on relaxed GeSn …

Low temperature growth of high crystallinity GeSn on amorphous layers for advanced optoelectronics

H Li, J Brouillet, A Salas, X Wang, J Liu - Optical Materials Express, 2013 - opg.optica.org
High crystallinity GeSn substitutional alloy thin films with up to 8.7 at.% Sn are directly grown
on amorphous SiO_2 layers at low crystallization temperatures of 370~ 470° C for potential …

Fabrication, characterization, and analysis of Ge/GeSn heterojunction p-type tunnel transistors

C Schulte-Braucks, R Pandey… - … on Electron Devices, 2017 - ieeexplore.ieee.org
We present a detailed study on fabrication and characterization of Ge/GeSn heterojunction p-
type tunnel-field-effect-transistors (TFETs). Critical process modules as high-k stack and pin …

Process modules for GeSn nanoelectronics with high Sn-contents

C Schulte-Braucks, S Glass, E Hofmann, D Stange… - Solid-State …, 2017 - Elsevier
This paper systematically studies GeSn n-FETs, from individual process modules to a
complete device. High-k gate stacks and NiGeSn metallic contacts for source and drain are …