CODATA recommended values of the fundamental physical constants: 2010

PJ Mohr, BN Taylor, DB Newell - Journal of Physical and Chemical …, 2012 - pubs.aip.org
1.1. Background This article reports work carried out under the auspices of the Committee
on Data for Science and Technology (CODATA) Task Group on Fundamental Constants. 1 It …

Improved measurement results for the Avogadro constant using a 28Si-enriched crystal

Y Azuma, P Barat, G Bartl, H Bettin, M Borys, I Busch… - Metrologia, 2015 - iopscience.iop.org
New results are reported from an ongoing international research effort to accurately
determine the Avogadro constant by counting the atoms in an isotopically enriched silicon …

Realization of the kilogram by the XRCD method

K Fujii, H Bettin, P Becker, E Massa, O Rienitz… - Metrologia, 2016 - iopscience.iop.org
When the kilogram is redefined in terms of the fixed numerical value of the Planck constant
h, the x-ray-crystal-density (XRCD) method, among others, is used for realizing the redefined …

Counting the atoms in a 28Si crystal for a new kilogram definition

B Andreas, Y Azuma, G Bartl, P Becker, H Bettin… - Metrologia, 2011 - iopscience.iop.org
This paper concerns an international research project aimed at determining the Avogadro
constant by counting the atoms in an isotopically enriched silicon crystal. The counting …

Progress on accurate measurement of the Planck constant: watt balance and counting atoms

SS Li, ZH Zhang, W Zhao, ZK Li, SL Huang - Chinese Physics B, 2014 - iopscience.iop.org
The Planck constant h is one of the most significant constants in quantum physics. Recently,
the precision measurement of the value of h has been a hot issue due to its important role for …

Measurement of the {2 2 0} lattice-plane spacing of a 28Si x-ray interferometer

E Massa, G Mana, U Kuetgens, L Ferroglio - Metrologia, 2011 - iopscience.iop.org
Abstract The spacing of the {2 2 0} lattice planes of a 28 Si crystal, used to determine the
Avogadro constant by counting silicon atoms, was measured by combined x-ray and optical …

A more accurate measurement of the 28Si lattice parameter

E Massa, CP Sasso, G Mana… - Journal of Physical and …, 2015 - pubs.aip.org
13. Relative directions of the reciprocal vector h of the diffracting planes, unit normal to the
analyser n (front mirror, with reference to the obverse layout of the analyser), and …

Precise determination of crystal lattice parameters

VV Lider - Physics-Uspekhi, 2020 - iopscience.iop.org
Precision X-ray methods for absolute and relative determination of crystal lattice parameters
(interplanar distances) are described and compared, including the X-ray divergent-beam …

Thickness Measurement of Oxide and Carbonaceous Layers on a 28Si Sphere by XPS

L Zhang, N Kuramoto, Y Azuma… - IEEE Transactions on …, 2016 - ieeexplore.ieee.org
Surface layer characterization is crucial for the high-accuracy determination of the Avogadro
constant using 28 Si enriched spheres to redefine the kilogram. In this paper, we measured …

The measurement of the silicon lattice parameter and the count of atoms to realise the kilogram

E Massa, CP Sasso, G Mana - MAPAN, 2020 - Springer
X-ray interferometry established a link between atomic and macroscopic realisations of the
metre. The possibility of measuring the silicon lattice parameter in terms of optical …