A review of reliability research on nanotechnology

SL Jeng, JC Lu, K Wang - IEEE Transactions on reliability, 2007 - ieeexplore.ieee.org
Nano-reliability measures the ability of a nano-scaled product to perform its intended
functionality. At the nano scale, the physical, chemical, and biological properties of materials …

A review of statistical methods for quality improvement and control in nanotechnology

JC Lu, SL Jeng, K Wang - Journal of Quality Technology, 2009 - Taylor & Francis
Nanotechnology has received a considerable amount of attention from various fields and
has become a multidisciplinary subject, where several research ventures have taken place …

Wear detection by means of wavelet-based acoustic emission analysis

D Baccar, D Söffker - Mechanical Systems and Signal Processing, 2015 - Elsevier
Wear detection and monitoring during operation are complex and difficult tasks especially
for materials under sliding conditions. Due to the permanent contact and repetitive motion …

Wavelet-based SPC procedure for complicated functional data

MK Jeong, JC Lu, N Wang - International Journal of Production …, 2006 - Taylor & Francis
Functional data characterize the quality or reliability performance of many manufacturing
processes. As can be seen in the literature, such data are informative in process monitoring …

End milling tool breakage detection using lifting scheme and Mahalanobis distance

H Cao, X Chen, Y Zi, F Ding, H Chen, J Tan… - International Journal of …, 2008 - Elsevier
In this paper, a novel method based on lifting scheme and Mahalanobis distance (MD) is
proposed for detection of tool breakage via acoustic emission (AE) signals generated in end …

An industrially viable wavelet long-short term memory-deep multilayer perceptron-based approach to tool condition monitoring considering operational variability

MU Gudelek, G Serin, AM Ozbayoglu… - Proceedings of the …, 2023 - journals.sagepub.com
Tool wear is a fundamental aspect of the machining process. Therefore, tool condition
monitoring is of paramount importance to ensure part quality and avoid catastrophic …

Wavelet-based data reduction techniques for process fault detection

MK Jeong, JC Lu, X Huo, B Vidakovic, D Chen - Technometrics, 2006 - Taylor & Francis
This article presents new data reduction methods based on the discrete wavelet transform to
handle potentially large and complicated nonstationary data curves. The methods minimize …

Dirichlet process Gaussian mixture models for real-time monitoring and their application to chemical mechanical planarization

JP Liu, OF Beyca, PK Rao, ZJ Kong… - IEEE Transactions …, 2016 - ieeexplore.ieee.org
The goal of this work is to use sensor data for online detection and identification of process
anomalies (faults). In pursuit of this goal, we propose Dirichlet process Gaussian mixture …

Process-machine interaction (PMI) modeling and monitoring of chemical mechanical planarization (CMP) process using wireless vibration sensors

PK Rao, MB Bhushan… - IEEE Transactions …, 2013 - ieeexplore.ieee.org
We present a deterministic process-machine interaction (PMI) model that can associate
different complex time-frequency patterns, including nonlinear dynamic behaviors that …

Application of wavelet transform to damage identification in the steel structure elements

A Knitter-Piątkowska, A Dobrzycki - Applied Sciences, 2020 - mdpi.com
This work concerns the concept and verification of the experimental possibility of using a
wavelet transform to assess a steel structure's condition. In the research, a developed …