Electromigration effects in power grids characterized from a 65 nm test chip
A 65 mn test chip to study electromigration (EM) events in integrated circuit power grids was
taped-out and successfully tested. A 9× 9 grid was implemented using M3 and M4 metal …
taped-out and successfully tested. A 9× 9 grid was implemented using M3 and M4 metal …
On-Chip Heater Design and Control Methodology for Reliability Testing Applications Requiring Over 300° C Local Temperatures
This paper presents the design details and control methodologies for on-chip heaters that
can provide fast and accurate local temperature control for reliability testing applications …
can provide fast and accurate local temperature control for reliability testing applications …
System-level simulation of electromigration in a 3 nm cmos power delivery network: The effect of grid redundancy, metallization stack and standard-cell currents
A physics-based system-level electromigration (EM) modelling platform is employed to
simulate EM and its impact on the IR drop from the supply voltage to the standard-cells for a …
simulate EM and its impact on the IR drop from the supply voltage to the standard-cells for a …
[HTML][HTML] Electromigration in Nano-Interconnects: Determining Reliability Margins in Redundant Mesh Networks Using a Scalable Physical–Statistical Hybrid Paradigm
H Zahedmanesh - Micromachines, 2024 - mdpi.com
This paper presents a hybrid modelling approach that combines physics-based
electromigration modelling (PEM) and statistical methods to evaluate the electromigration …
electromigration modelling (PEM) and statistical methods to evaluate the electromigration …
A Novel System-Level Physics-Based Electromigration Modelling Framework: Application to the Power Delivery Network
Electromigration has been a major reliability concern for nano-interconnects in CMOS
applications. With further CMOS miniaturization, the cross-sectional area of nano …
applications. With further CMOS miniaturization, the cross-sectional area of nano …
A pragmatic network-aware paradigm for system-level electromigration predictions at scale
The standard approach for electro migration (EM) compliance checks of CMOS systems is
based on failure statistics from EM tests on single isolated interconnects. Thus, when …
based on failure statistics from EM tests on single isolated interconnects. Thus, when …
Electromigration Test Chip Experiments from Realistic Power Grid Structures: Failure Trend Comparison and Statistical Analysis
YH Yi, C Kim, A Kteyan, A Volkov… - 2024 IEEE …, 2024 - ieeexplore.ieee.org
This work presents electromigration (EM) silicon data from realistic power grid device-under-
tests (DUT). Power grids featuring logic gate equivalent quasi-load cells were generated by …
tests (DUT). Power grids featuring logic gate equivalent quasi-load cells were generated by …
[PDF][PDF] Contribution à la fiabilisation des interconnexions 3D dans le cadre du développement des capteurs photographiques
S Moreau - 2024 - cea.hal.science
Tout d'abord, je tiens à adresser mes plus vifs remerciements aux rapporteurs Alain
BRAVAIX, Roland FORTUNIER et Guillaume PARRY pour avoir consacré leur temps et leur …
BRAVAIX, Roland FORTUNIER et Guillaume PARRY pour avoir consacré leur temps et leur …
Studying the Impact of Temperature Gradient on Electromigration Lifetime Using a Power Grid Test Structure with On-Chip Heaters
This work presents statistical data collected from 38 power grid test structures showing the
detailed impact of temperature gradient on electro migration (EM) lifetime. The failure time …
detailed impact of temperature gradient on electro migration (EM) lifetime. The failure time …