Extreme ultraviolet lithography

D Kazazis, JG Santaclara, J van Schoot… - Nature Reviews …, 2024 - nature.com
Extreme ultraviolet lithography (EUVL) was recently adopted by the semiconductor industry
as the leading-edge lithography technique for continued miniaturization of semiconductor …

Physical methods for controlling bacterial colonization on polymer surfaces

C Echeverria, MDT Torres, M Fernández-García… - Biotechnology …, 2020 - Elsevier
The adhesion and formation of microbial biofilm on material surfaces is a relevant problem
in many areas including in medicine and biomaterials engineering. Biofilms are the primary …

[HTML][HTML] Beyond EUV lithography: a comparative study of efficient photoresists' performance

N Mojarad, J Gobrecht, Y Ekinci - Scientific reports, 2015 - nature.com
Extreme ultraviolet (EUV) lithography at 13.5 nm is the main candidate for patterning
integrated circuits and reaching sub-10-nm resolution within the next decade. Should …

Sub-10 nanometer feature size in silicon using thermal scanning probe lithography

YK Ryu Cho, CD Rawlings, H Wolf, M Spieser, S Bisig… - ACS …, 2017 - ACS Publications
High-resolution lithography often involves thin resist layers which pose a challenge for
pattern characterization. Direct evidence that the pattern was well-defined and can be used …

Nanostructure and microstructure fabrication: from desired properties to suitable processes

P van Assenbergh, E Meinders, J Geraedts, D Dodou - Small, 2018 - Wiley Online Library
When designing a new nanostructure or microstructure, one can follow a processing‐based
manufacturing pathway, in which the structure properties are defined based on the …

Interference lithography at EUV and soft X-ray wavelengths: Principles, methods, and applications

N Mojarad, J Gobrecht, Y Ekinci - Microelectronic Engineering, 2015 - Elsevier
Interference lithography is an effective method of patterning periodic structures with limits set
by light diffraction. Using this method at the short wavelengths of extreme ultraviolet (EUV) …

Absorption coefficient of metal-containing photoresists in the extreme ultraviolet

R Fallica, J Haitjema, L Wu… - Journal of Micro …, 2018 - spiedigitallibrary.org
The amount of absorbed light in thin photoresist films is a key parameter in photolithographic
processing, but its experimental measurement is not straightforward. The optical absorption …

[PDF][PDF] The Silicon Age: Trends in Semiconductor Devices Industry.

KY Kamal - Journal of Engineering Science & Technology …, 2022 - pdfs.semanticscholar.org
The semiconductor devices industry is one of the most significant sectors, based on its broad
applications and substantial economic and strategic implications. This article overviews the …

Extreme ultraviolet patterning of tin-oxo cages

J Haitjema, Y Zhang, M Vockenhuber… - Journal of Micro …, 2017 - spiedigitallibrary.org
We report on the extreme ultraviolet (EUV) patterning performance of tin-oxo cages. These
cage molecules were already known to function as a negative tone photoresist for EUV …

Organotin in nonchemically amplified polymeric hybrid resist imparts better resolution with sensitivity for next-generation lithography

J Peter, MG Moinuddin, S Ghosh… - ACS Applied Polymer …, 2020 - ACS Publications
Given the need for a next-generation technology node in the area of integrated circuits (ICs),
improvement in the properties of resist materials, particularly sensitivity (ED), resolution …