Graphene and related materials for resistive random access memories

F Hui, E Grustan‐Gutierrez, S Long… - Advanced Electronic …, 2017 - Wiley Online Library
Graphene and related materials (GRMs) are promising candidates for the fabrication of
resistive random access memories (RRAMs). Here, this emerging field is analyzed …

A review on resistive switching in high-k dielectrics: a nanoscale point of view using conductive atomic force microscope

M Lanza - Materials, 2014 - mdpi.com
Metal-Insulator-Metal (MIM) structures have raised as the most promising configuration for
next generation information storage, leading to great performance and fabrication-friendly …

Electronic synapses made of layered two-dimensional materials

Y Shi, X Liang, B Yuan, V Chen, H Li, F Hui, Z Yu… - Nature …, 2018 - nature.com
Neuromorphic computing systems, which use electronic synapses and neurons, could
overcome the energy and throughput limitations of today's computing architectures …

On the use of two dimensional hexagonal boron nitride as dielectric

F Hui, C Pan, Y Shi, Y Ji, E Grustan-Gutierrez… - Microelectronic …, 2016 - Elsevier
Recent advances in materials science allowed the incorporation of advanced two
dimensional (2D) materials in electronic devices. For example, field effect transistors (FETs) …

On the quality of commercial chemical vapour deposited hexagonal boron nitride

Y Yuan, J Weber, J Li, B Tian, Y Ma, X Zhang… - Nature …, 2024 - nature.com
The semiconductors industry has put its eyes on two-dimensional (2D) materials produced
by chemical vapour deposition (CVD) because they can be grown at the wafer level with …

: a physical model for RRAM devices simulation

MA Villena, JB Roldán, F Jiménez-Molinos… - Journal of …, 2017 - Springer
In the last few years, resistive random access memory (RRAM) has been proposed as one of
the most promising candidates to overcome the current Flash technology in the market of …

Nanoscale characterization of resistive switching using advanced conductive atomic force microscopy based setups

M Lanza, U Celano, F Miao - Journal of Electroceramics, 2017 - Springer
Conductive atomic force microscopy (CAFM) is a powerful tool for studying resistive
switching at the nanoscale. By applying sequences of IV curves and biased scans the write …

Texture Transfer in Dielectric Layers via Nanocrystalline Networks: Insights from in Situ 4D-STEM

R Winkler, A Zintler, O Recalde-Benitez, T Jiang… - Nano Letters, 2024 - ACS Publications
Transition metal oxide dielectric layers have emerged as promising candidates for various
relevant applications, such as supercapacitors or memory applications. However, the …

Understanding current instabilities in conductive atomic force microscopy

L Jiang, J Weber, FM Puglisi, P Pavan, L Larcher… - Materials, 2019 - mdpi.com
Conductive atomic force microscopy (CAFM) is one of the most powerful techniques in
studying the electrical properties of various materials at the nanoscale. However …

A review of advanced scanning probe microscope analysis of functional films and semiconductor devices

G Benstetter, R Biberger, D Liu - Thin Solid Films, 2009 - Elsevier
This paper gives an overview of established methods and new developments in the field of
Scanning Probe Microscopy (SPM) of functional films and semiconductor devices. It focuses …