Atomic force and shear force based tip-enhanced Raman spectroscopy and imaging

SS Kharintsev, GG Hoffmann, PS Dorozhkin… - …, 2007 - iopscience.iop.org
Underlying near-field optical effects on the nanoscale have stimulated the development of
apertureless vibrational spectroscopy and imaging with ultrahigh spatial resolution. We …

Analytical features of particle counting sensor based on plasmon assisted microscopy of nano objects

EL Gurevich, VV Temchura, K Überla… - Sensors and Actuators B …, 2011 - Elsevier
We present a new analytical method for concentration measurements of nano objects of
different nature such as polystyrene nanoparticles or viruses. The method is based on …

An inverse problem of estimating the heat source in tapered optical fibers for scanning near-field optical microscopy

HL Lee, WJ Chang, WL Chen, YC Yang - Ultramicroscopy, 2007 - Elsevier
A conjugate gradient method based on inverse algorithm is applied in this study to estimate
the unknown space-and time-dependent heat source in aluminum-coated tapered optical …

Surface plasmon and surface wave microscopy

P Török, FJ Kao - Optical Imaging and Microscopy: Techniques and …, 2007 - Springer
Surface plasmons are electromagnetic surface waves confined to the region between two
dielectrics and a conductor. These waves have unique features, since the field at the …

Sensitivity analysis of scanning near-field optical microscope probe

TH Fang, WJ Chang - Optics & Laser Technology, 2003 - Elsevier
In this paper, we study the dynamic modes of a scanning near-field optical microscope
(SNOM) which uses an optical fiber probe; and the sensitivity of flexural and axial vibration …

Vibration sensitivity of the scanning near-field optical microscope with a tapered optical fiber probe

WJ Chang, TH Fang, HL Lee, YC Yang - Ultramicroscopy, 2005 - Elsevier
In this paper the Rayleigh–Ritz method was used to study the scanning near-field optical
microscope (SNOM) with a tapered optical fiber probe's flexural and axial sensitivity to …

An inverse method for determining the interaction force between the probe and sample using scanning near-field optical microscopy

WJ Chang, TH Fang - Physics Letters A, 2006 - Elsevier
This study proposes a means for calculating the interaction force during the scanning
process using a scanning near-field optical microscope (SNOM) probe. The determination of …

Fourier analysis of surface plasmon waves launched from single nanohole and nanohole arrays: unraveling tip-induced effects

YC Chang, JY Chu, TJ Wang, MW Lin, JT Yeh… - Optics express, 2008 - opg.optica.org
The authors report the investigation of surface plasmon waves (SPW) generated by single
nanohole and nanohole arrays. Scattering-type scanning near-field microscopy is used to …

Lithium fluoride films and crystals containing metallic colloids studied by scanning near-field optical microscopy

V Mussi, A Cricenti, RM Montereali… - Physical Chemistry …, 2002 - pubs.rsc.org
LiF films and crystals containing lithium colloids have been studied by scanning near-field
optical microscopy (SNOM). Scattering phenomena and possible wave-guided modes have …

Damping vibration of scanning near-field optical microscope probe using the Timoshenko beam model

TYF Chen, HL Lee - Microelectronics journal, 2009 - Elsevier
The effect of interactive damping on the flexural vibration frequency for the scanning near-
field optical microscope (SNOM) fiber probe based on the Timoshenko beam theory …