Complex field fault modeling-based optimal frequency selection in linear analog circuit fault diagnosis
C Yang, J Yang, Z Liu, S Tian - IEEE Transactions on …, 2013 - ieeexplore.ieee.org
Owing to the lack of feasible fault modeling method, hard (open and short) faults, and
discretized parametric faults are still the mostly used fault models. These models cannot …
discretized parametric faults are still the mostly used fault models. These models cannot …
Circle equation-based fault modeling method for linear analog circuits
S Tian, CL Yang, F Chen, Z Liu - IEEE Transactions on …, 2014 - ieeexplore.ieee.org
Owing to the lack of feasible fault modeling method, hard (open and short) faults and
discrete parameter faults are still the mostly used fault models. These models cannot …
discrete parameter faults are still the mostly used fault models. These models cannot …
Circuit implementation of a supply current spectrum test method
MG Dimopoulos, AD Spyronasios… - IEEE Transactions …, 2010 - ieeexplore.ieee.org
A supply current spectrum test method is developed in this work, and its implementation
using measurements of various analog circuits is presented. Statistical data from fault-free …
using measurements of various analog circuits is presented. Statistical data from fault-free …
[PDF][PDF] ΑΡΙΣΤΟΤΕΛΕΙΟ ΠΑΝΕΠΙΣΤΗΜΙΟ ΘΕΣΣΑΛΟΝΙΚΗΣ ΣΧΟΛΗ ΟΙΚΟΝΟΜΙΚΩΝ ΚΑΙ ΠΟΛΙΤΙΚΩΝ ΕΠΙΣΤΗΜΩΝ
Τ ΜΜΕ - ikee.lib.auth.gr
Το ερέθισμα για την παρούσα διδακτορική διατριβή δόθηκε πριν πολλά χρόνια, όταν ως
3ετής φοιτητής της Γαλλικής Γλώσσας και Φιλολογίας μου δόθηκε η ευκαιρία να …
3ετής φοιτητής της Γαλλικής Γλώσσας και Φιλολογίας μου δόθηκε η ευκαιρία να …