[HTML][HTML] Mechanical Characterization of Sintered Silver Materials for Power Device Packaging: A Review

K Wakamoto, T Namazu - Energies, 2024 - mdpi.com
This paper reviews sintered silver (s-Ag) die-attach materials for wide band gap (WBG)
semiconductor packaging. WBG devices that die-attach with s-Ag have attracted a lot of …

Physics of failure based lifetime modelling for sintered silver die attach in power electronics: Accelerated stress testing by isothermal bending and thermal shock in …

J Heilmann, B Wunderle, U Zschenderlein… - Microelectronics …, 2023 - Elsevier
The employment of sintered silver (SAG) as die attach material is one of the most promising
solutions to utilize the advantages of wide bandgap semiconductors in modern power …

Degradation mechanism of pressure-assisted sintered silver by thermal shock test

K Wakamoto, T Otsuka, K Nakahara, T Namazu - Energies, 2021 - mdpi.com
This paper investigates the degradation mechanism of pressure-sintered silver (s-Ag) film for
silicon carbide (SiC) chip assembly with a 2-millimeter-thick copper substrate by means of …

Degradation mechanism of silver sintering die attach based on thermal and mechanical reliability testing

K Wakamoto, T Otsuka, K Nakahara… - IEEE Transactions …, 2023 - ieeexplore.ieee.org
This article investigates the degradation mechanism of sintered silver (s-Ag) layer in silicon
carbide (SiC) die attach by means of thermal shocked test (TST) and nine-point bending test …

TIMs for transfer molded power modules: Characterization, reliability, and modeling

A Sitta, G Mauromicale, GL Malgioglio… - Microelectronics …, 2023 - Elsevier
This work presents an integrated experimental–numerical method to characterize, model,
and experimentally study the properties of transfer molded power modules, considering two …

Comparison of sintered silver die attach failure between thermal shock test and mechanical cycling test

K Wakamoto, Y Kumakiri, T Otsuka… - Japanese Journal of …, 2022 - iopscience.iop.org
This paper compares the degradation of sintered silver (s-Ag) die attach between a thermal
shock test (TST) and a mechanical cycling test to correctly understand the mechanism of s …

Fracture Mechanism of Sintered Silver Film Revealed by in-situ SEM Uniaxial Tensile Loading

K Wakamoto, D Yasugi, T Otsuka… - IEEE Transactions …, 2024 - ieeexplore.ieee.org
This article investigates the mechanism of brittle-ductile deformation and fracture for sintered
silver (s-Ag) film by means of in situ scanning electron microscopy (SEM) uniaxial tensile …

Sintering mechanism between silver nanoparticles and SiC/Cu plates: A molecular dynamics simulation

G Ye, J Zhang, P Zhang, K Meng - Powder Technology, 2024 - Elsevier
A “sandwich” MD model composed of silver nanoparticles (AgNPs) and SiC/Cu plates was
constructed to examine the interconnection quality of interfaces between nanoparticles and …

Low-Temperature Sinterable Cu@ Ag Paste with Superior Strength Driven by Pre-Heating Process

M Won, D Kim, H Yang, C Oh - Energies, 2023 - mdpi.com
To preserve the structural integrity of power semiconductor devices, ensuring a reliable
connection between wide-bandgap (WBG) chips and their substrates at temperatures above …

Evaluation of internal stress distribution during sintering of compacts using a computational framework

T Matsuda - Materials Today Communications, 2023 - Elsevier
Computational modeling for manufacturing is a promising candidate for accelerating the
development of devices consisting of compressed sintered powders. Understanding the …