The matrix effect in organic secondary ion mass spectrometry

AG Shard, SJ Spencer, SA Smith, R Havelund… - International Journal of …, 2015 - Elsevier
Well defined reference materials consisting of Irganox 1010 and either Irganox 1098 or
Fmoc-pentafluoro-l-phenylalanine (Fmoc-PFLPA) are described. These have been analysed …

SIMS of organics—Advances in 2D and 3D imaging and future outlook

IS Gilmore - Journal of Vacuum Science & Technology A, 2013 - pubs.aip.org
Secondary ion mass spectrometry (SIMS) has become a powerful technique for the label-
free analysis of organics from cells to electronic devices. The development of cluster ion …

Analysis of chemotherapeutic drug delivery at the single cell level using 3D-MSI-TOF-SIMS

QP Vanbellingen, A Castellanos… - Journal of The …, 2016 - ACS Publications
In this work, we show the advantages of label-free, tridimensional mass spectrometry
imaging using dual beam analysis (25 keV Bi3+) and depth profiling (20 keV with a …

ToF–SIMS imaging of molecular-level alteration mechanisms in Le Bonheur de vivre by Henri Matisse

ZE Voras, K deGhetaldi, MB Wiggins, B Buckley… - Applied Physics A, 2015 - Springer
Time-of-flight secondary ion mass spectrometry (ToF–SIMS) has recently been shown to be
a valuable tool for cultural heritage studies, especially when used in conjunction with …

VAMAS interlaboratory study on organic depth profiling

AG Shard, S Ray, MP Seah… - Surface and interface …, 2011 - Wiley Online Library
We present the results of a VAMAS (Versailles project on Advanced Materials and
Standards) interlaboratory study on organic depth profiling, in which twenty laboratories …

Study of experimental variability in TOF-SIMS mass spectrometry imaging of biological samples

C Bich, D Touboul, A Brunelle - International Journal of Mass Spectrometry, 2013 - Elsevier
Studies of the chemical composition of organs using mass spectrometry imaging become an
important issue to better understand the mechanisms involved in various diseases …

Linearity of the instrumental intensity scale in TOF‐SIMS—a VAMAS interlaboratory study

JLS Lee, IS Gilmore, MP Seah - Surface and interface analysis, 2012 - Wiley Online Library
A VAMAS interlaboratory study involving 21 time‐of‐flight SIMS instruments from nine
countries has been conducted to evaluate the linearity of the instrumental intensity scale and …

Bayesian integration and classification of composition C-4 plastic explosives based on time-of-flight-secondary ion mass spectrometry and laser ablation-inductively …

CM Mahoney, RT Kelly, L Alexander… - Analytical …, 2016 - ACS Publications
Time-of-flight-secondary ion mass spectrometry (TOF-SIMS) and laser ablation-inductively
coupled plasma mass spectrometry (LA-ICPMS) were used for characterization and …

Active learning for convenient annotation and classification of secondary ion mass spectrometry images

M Hanselmann, J Röder, U Köthe… - Analytical …, 2013 - ACS Publications
Digital staining for the automated annotation of mass spectrometry imaging (MSI) data has
previously been achieved using state-of-the-art classifiers such as random forests or support …

Formation of multilayer ultrathin assemblies using chemical lithography

C Zhou, AV Walker - Langmuir, 2010 - ACS Publications
Ultrathin complex multilayer structures have many potential applications in molecular and
organic electronics, sensing, biotechnology and other areas. Reported here is a method by …