A Comprehensive Survey on Machine Learning Driven Material Defect Detection: Challenges, Solutions, and Future Prospects

J Bai, D Wu, T Shelley, P Schubel, D Twine… - arXiv preprint arXiv …, 2024 - arxiv.org
Material defects (MD) represent a primary challenge affecting product performance and
giving rise to safety issues in related products. The rapid and accurate identification and …