A survey of leakage reduction techniques in CMOS digital circuits for nanoscale regime
VK Sharma - Australian journal of electrical and electronics …, 2021 - Taylor & Francis
The battery-driven portable systems are the lifeline of the modern era. Very large-scale
integration (VLSI) designers are continuously working to enhance the performance of the …
integration (VLSI) designers are continuously working to enhance the performance of the …
A simulation study of nbti impact on 14-nm node finfet technology for logic applications: Device degradation to circuit-level interaction
A comprehensive simulation flow is demonstrated to assess the negative-bias temperature
instability (NBTI) impact on the performance and power of digital logic circuits based on the …
instability (NBTI) impact on the performance and power of digital logic circuits based on the …
NBTI Effect Survey for Low Power Systems in Ultra-Nanoregime
Background: Electronic device scaling with the advancement of technology nodes maintains
the performance of the logic circuits with area benefit. Metal oxide semiconductor (MOS) …
the performance of the logic circuits with area benefit. Metal oxide semiconductor (MOS) …
Design and Simulation for NBTI Aware Logic Gates
Reliability of the electronic circuits is one of the most prominent factor in the development of
very large-scale integration (VLSI) industry. Huge demand for compact size and high …
very large-scale integration (VLSI) industry. Huge demand for compact size and high …
An Investigation for the Negative-Bias Temperature Instability Aware CMOS Logic
Background: Scaling of the dimensions of semiconductor device plays a very important role
in the advancement of Very Large-Scale Integration (VLSI) technology. There are many …
in the advancement of Very Large-Scale Integration (VLSI) technology. There are many …
NBTI and power reduction using an input vector control and supply voltage assignment method
P Sun, Z Yang, Y Yu, J Li, X Peng - Algorithms, 2017 - mdpi.com
As technology scales, negative bias temperature instability (NBTI) becomes one of the
primary failure mechanisms for Very Large Scale Integration (VLSI) circuits. Meanwhile, the …
primary failure mechanisms for Very Large Scale Integration (VLSI) circuits. Meanwhile, the …
NBTI and power reduction using a workload-aware supply voltage assignment approach
Y Yu, J Liang, Z Yang, X Peng - Journal of Electronic Testing, 2018 - Springer
Supply voltage assignment (SVA) can alleviate the performance aging induced by the
negative bias temperature instability (NBTI) effect. However, due to the random …
negative bias temperature instability (NBTI) effect. However, due to the random …
Evaluation of mirror full adder circuit reliability performance due to negative bias temperature instability (NBTI) effects based on different defect mechanisms
IB Shaari, MF Zainudin, MSA Saini, H Hussin… - AIP Conference …, 2017 - pubs.aip.org
Negative bias temperature instability (NBTI) is an aging effect that can cause the threshold
voltage to be shifted hence reduce the drain current. This will subsequently leads to main …
voltage to be shifted hence reduce the drain current. This will subsequently leads to main …